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TITLE: Comparative analysis of MIG brazing modes: process stability, bead morphology, microstructure, and mechanical properties  Full Text
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
INDEXED IN: Scopus WOS
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TITLE: Comparative analysis of MIG brazing modes: Process stability, bead morphology, microstructure, and mechanical properties (Sept, 10.1007/s00170-024-14488-6, 2024)  Full Text
AUTHORS: Singh, Jaivindra; Arora, Kanwer Singh; Oliveira, Joao P.; Asati, Brajesh;
PUBLISHED: 2024, SOURCE: INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
INDEXED IN: WOS
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TITLE: Fresh osteochondral allograft transplantation of the medial femoral condyle in an elite football player
AUTHORS: Oliveira, Joao Pedro; Mendes, Joao Castro; Fonseca, Fernando;
PUBLISHED: 2024, SOURCE: BMJ CASE REPORTS, VOLUME: 17, ISSUE: 12
INDEXED IN: Scopus WOS
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TITLE: Impact and compensation of carrier synchronization errors in OFDM signals with very large QAM constellations
AUTHORS: Mokhtari, Zahra; Dinis, Rui; Oliveira, Luis; Oliveira, Joao;
PUBLISHED: 2023, SOURCE: IET COMMUNICATIONS, VOLUME: 17, ISSUE: 9
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
16
TITLE: A Skew-Insensitive Switched Source-Follower Analog Frontend for Time-Interleaved ADCs
AUTHORS: Leonardo, David; Xavier, Joao; Oliveira, Joao; Goes, Joao;
PUBLISHED: 2023, SOURCE: 18th International Conference on Ph.D Research in Microelectronics and Electronics (PRIME) in 2023 18TH CONFERENCE ON PH.D RESEARCH IN MICROELECTRONICS AND ELECTRONICS, PRIME
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
17
TITLE: Introduction: Metalinguistic Disagreement and Semantic Externalism  Full Text
AUTHORS: Abreu, Pedro; Terzian, Giulia;
PUBLISHED: 2023, SOURCE: TOPOI-AN INTERNATIONAL REVIEW OF PHILOSOPHY
INDEXED IN: Scopus WOS
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TITLE: Design of an RF-CMOS Switched-Capacitor Power Amplifier for NB-IoT RF Transceivers
AUTHORS: Ana Isabel Santos; Joao Pedro Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
INDEXED IN: Scopus CrossRef: 1
IN MY: ORCID
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TITLE: Assessment of the Zero Distortion Bias Point Using Design-Oriented 7-Parameter MOSFET Model
AUTHORS: Rodrigo Pinto; Pedro Toledo; Joao Oliveira;
PUBLISHED: 2023, SOURCE: 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023 in Proceedings - 2023 International Young Engineers Forum in Electrical and Computer Engineering, YEF-ECE 2023
INDEXED IN: Scopus CrossRef
IN MY: ORCID
20
TITLE: Adaptive Learning and AI to Support Medication Management
AUTHORS: João Oliveira; Nazanin Vafaei; Vasco Delgado Gomes; Paulo Figueiras; Carlos Agostinho; Ricardo Jardim Gonçalves;
PUBLISHED: 2023, SOURCE: 29th International Conference on Engineering, Technology, and Innovation, ICE 2023 in Proceedings of the 29th International Conference on Engineering, Technology, and Innovation: Shaping the Future, ICE 2023
INDEXED IN: Scopus CrossRef
IN MY: ORCID
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