José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
171
TITLE: Neural network application in a carbon monoxide measurement system
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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ORCID172
TITLE: Neural networks in automated measurement systems: State of the art and new research trends
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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ORCID173
TITLE: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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ORCID174
TITLE: Microcontroller - based data processing for non-linear measuring sensors
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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ORCID175
TITLE: Laser based smart displacement sensor
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
176
TITLE: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
177
TITLE: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
INDEXED IN: Scopus 
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ORCID178
TITLE: Minimising temperature drift errors of conditioning circuits using artificial neural networks Full Text
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
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ORCID179
TITLE: New virtual instrument for temperature measurement based on a photodiode excited by a laser source
AUTHORS: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
AUTHORS: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLISHED: 1998, SOURCE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
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ORCID180
TITLE: A temperature sensor fault detector as an Artificial Neural Network application
AUTHORS: Postelache, O ; Girao, PS; Ramos, HG ; Pereira, JMD;
PUBLISHED: 1998, SOURCE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2
AUTHORS: Postelache, O ; Girao, PS; Ramos, HG ; Pereira, JMD;
PUBLISHED: 1998, SOURCE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2
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