José Miguel Costa Dias Pereira
AuthID: R-000-8RJ
171
TITLE: A distributed virtual instrument for indoor air monitoring
AUTHORS: Postolache, O; Giro, PS; Ramos, HG ; Pereira, MD;
PUBLISHED: 2001, SOURCE: 5th International Conference on Electronic Measurement and Instruments in ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS
AUTHORS: Postolache, O; Giro, PS; Ramos, HG ; Pereira, MD;
PUBLISHED: 2001, SOURCE: 5th International Conference on Electronic Measurement and Instruments in ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS
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WOS
172
TITLE: Fitting transducer characteristics to measured data Full Text
AUTHORS: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLISHED: 2001, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, ISSUE: 4
AUTHORS: Dias Pereira, JM; Silva Girao, PMB; Postolache, O ;
PUBLISHED: 2001, SOURCE: IEEE Instrumentation and Measurement Magazine, VOLUME: 4, ISSUE: 4
173
TITLE: Neural network application in a carbon monoxide measurement system
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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ORCID
174
TITLE: Neural networks in automated measurement systems: State of the art and new research trends
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
AUTHORS: Postolache, O ; Girao, P; Pereira, M;
PUBLISHED: 2001, SOURCE: International Joint Conference on Neural Networks (IJCNN'01) in Proceedings of the International Joint Conference on Neural Networks, VOLUME: 3
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ORCID
175
TITLE: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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ORCID
176
TITLE: Microcontroller - based data processing for non-linear measuring sensors
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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Scopus
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ORCID
177
TITLE: Laser based smart displacement sensor
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTHORS: Postolache O.; Pereira M.; Girão P.;
PUBLISHED: 2001, SOURCE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
178
TITLE: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
AUTHORS: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLISHED: 2000, SOURCE: Microwave and Optical Technology Letters, VOLUME: 26, ISSUE: 4
179
TITLE: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
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ORCID
180
TITLE: Minimising temperature drift errors of conditioning circuits using artificial neural networks Full Text
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
AUTHORS: Pereira, JMD; Postolache, O ; Girao, PS ; Cretu, M;
PUBLISHED: 1998, SOURCE: 15th Annual IEEE Instrumentation and Measurement Technology Conference on Where Instrumentation is Going (IMTC 98) in WHERE INSTRUMENTATION IS GOING - CONFERENCE PROCEEDINGS, VOLS 1 AND 2, VOLUME: 1
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ORCID