Chevrier
AuthID: R-002-XQA
21
TITLE: Lattice instability in aluminum-silicon solid solutions Full Text
AUTHORS: Chevrier, J; Suck, JB; Lasjuanias, JC;
PUBLISHED: 1993, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 156-158, ISSUE: PART 2
AUTHORS: Chevrier, J; Suck, JB; Lasjuanias, JC;
PUBLISHED: 1993, SOURCE: Journal of Non-Crystalline Solids, VOLUME: 156-158, ISSUE: PART 2
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22
TITLE: Silicide epilayers: recent developments and prospects for a Si-compatible technology Full Text
AUTHORS: Derrien, J; Chevrier, J; Le Thanh, V; Crumbaker, TE; Natoli, JY; Berbezier, I;
PUBLISHED: 1993, SOURCE: Applied Surface Science, VOLUME: 70-71, ISSUE: PART 2
AUTHORS: Derrien, J; Chevrier, J; Le Thanh, V; Crumbaker, TE; Natoli, JY; Berbezier, I;
PUBLISHED: 1993, SOURCE: Applied Surface Science, VOLUME: 70-71, ISSUE: PART 2
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23
TITLE: Strained and relaxed semiconducting silicide layers heteroepitaxially grown on silicon
AUTHORS: Chevrier, J; Thanh Vinh Le; Derrien, J;
PUBLISHED: 1993, SOURCE: Scanning Microscopy, VOLUME: 7, ISSUE: 2
AUTHORS: Chevrier, J; Thanh Vinh Le; Derrien, J;
PUBLISHED: 1993, SOURCE: Scanning Microscopy, VOLUME: 7, ISSUE: 2
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24
TITLE: Synthesis and properties of epitaxial semiconducting silicides Full Text
AUTHORS: Derrien, J; Chevrier, J; Thanh Vinh, L; Berbezier, I; Giannini, C; Lagomarsino, S; Grimaldi, MG;
PUBLISHED: 1993, SOURCE: Applied Surface Science, VOLUME: 73, ISSUE: C
AUTHORS: Derrien, J; Chevrier, J; Thanh Vinh, L; Berbezier, I; Giannini, C; Lagomarsino, S; Grimaldi, MG;
PUBLISHED: 1993, SOURCE: Applied Surface Science, VOLUME: 73, ISSUE: C
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25
TITLE: Epitaxial growth of β-FeSi2 on silicon (111): a real-time RHEED analysis Full Text
AUTHORS: Chevrier, J; Le Thanh, V; Nitsche, S; Derrien, J;
PUBLISHED: 1992, SOURCE: Applied Surface Science, VOLUME: 56-58, ISSUE: PART 1
AUTHORS: Chevrier, J; Le Thanh, V; Nitsche, S; Derrien, J;
PUBLISHED: 1992, SOURCE: Applied Surface Science, VOLUME: 56-58, ISSUE: PART 1
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26
TITLE: Infrared and electrical properties of thin films and junctions of β-FeSi2 Full Text
AUTHORS: Lefki, K; Muret, P; Cherief, N; Bustarret, E; Nguyen, TTA; Boutarek, N; Madar, R; Chevrier, J; Derrien, J; Brunel, M;
PUBLISHED: 1992, SOURCE: Sensors and Actuators: A. Physical, VOLUME: 33, ISSUE: 1-2
AUTHORS: Lefki, K; Muret, P; Cherief, N; Bustarret, E; Nguyen, TTA; Boutarek, N; Madar, R; Chevrier, J; Derrien, J; Brunel, M;
PUBLISHED: 1992, SOURCE: Sensors and Actuators: A. Physical, VOLUME: 33, ISSUE: 1-2
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27
TITLE: Phase transition on the Si(111) surface: a first order phase transition under strain? Full Text
AUTHORS: Chevrier, J; Vinh, LT; Cruz, A;
PUBLISHED: 1992, SOURCE: Surface Science, VOLUME: 268, ISSUE: 1-3
AUTHORS: Chevrier, J; Vinh, LT; Cruz, A;
PUBLISHED: 1992, SOURCE: Surface Science, VOLUME: 268, ISSUE: 1-3
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28
TITLE: Semiconducting silicide-silicon heterostructures: growth, properties and applications Full Text
AUTHORS: Derrien, J; Chevrier, J; Le Thanh, V; Mahan, JE;
PUBLISHED: 1992, SOURCE: Applied Surface Science, VOLUME: 56-58, ISSUE: PART 1
AUTHORS: Derrien, J; Chevrier, J; Le Thanh, V; Mahan, JE;
PUBLISHED: 1992, SOURCE: Applied Surface Science, VOLUME: 56-58, ISSUE: PART 1
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29
TITLE: Infrared and Raman characterization of beta iron silicide Full Text
AUTHORS: Lefki, K; Muret, P; Bustarret, E; Boutarek, N; Madar, R; Chevrier, J; Derrien, J; Brunel, M;
PUBLISHED: 1991, SOURCE: Solid State Communications, VOLUME: 80, ISSUE: 10
AUTHORS: Lefki, K; Muret, P; Bustarret, E; Boutarek, N; Madar, R; Chevrier, J; Derrien, J; Brunel, M;
PUBLISHED: 1991, SOURCE: Solid State Communications, VOLUME: 80, ISSUE: 10
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30
TITLE: Correlation between thermal stability and dynamical properties in CuZr amorphous alloys Full Text
AUTHORS: Chevrier, J;
PUBLISHED: 1988, SOURCE: Solid State Communications, VOLUME: 65, ISSUE: 12
AUTHORS: Chevrier, J;
PUBLISHED: 1988, SOURCE: Solid State Communications, VOLUME: 65, ISSUE: 12
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