ProfileOfResearchers

264

TITLE: Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb Full Text
AUTHORS: Corregidor, V ; Barradas, NP ; Alves, E ; Franco, N; Alves, LC ; Chaves, PC ; Miguel A. Reis ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4

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265

TITLE: Rutherford backscattering and X-ray reflectivity analysis of tunnel barriers Full Text
AUTHORS: Franco, N; Yavorovskiy, IV; Fonseca, A; Gouveia, JAA; Marques, C; Alves, E ; Ferreira, RA; Freitas, PP ; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2

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266

TITLE: The stopping cross-section of aluminum for He ions Full Text
AUTHORS: Bianconi, M; Barradas, NP ; Correra, L;
PUBLISHED: 2005, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 239, ISSUE: 3

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267

TITLE: XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates Full Text
AUTHORS: Franco, N; Barradas, NP ; Alves, E ; Vallera, AM; Morris, RJH; Mironov, OA; Parker, EHC;
PUBLISHED: 2005, SOURCE: Symposium on Materials Science and Device Issues for Future Si-Based Technologies held at the 2005 EMRS Meeting in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 124, ISSUE: SUPPL.

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268

TITLE: A general artificial neural network for analysis of RBS data of any element with Z between 18 and 83 implanted into any lighter one- or two-element target Full Text
AUTHORS: Barradas, NP ; Patricio, RN; Pinho, HFR; Vieira, A;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4

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269

TITLE: Atomic environment and interfacial structural order of TiAlN/Mo multilayers Full Text
AUTHORS: Tavares, CJ ; Rebouta, L ; Riviere, JP; Girardeau, T; Goudeau, P; Alves, E ; Barradas, NP ;
PUBLISHED: 2004, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 187, ISSUE: 2-3

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270

TITLE: Bonding structure and hydrogen content in silicon nitride thin films deposited by the electron cyclotron resonance plasma method Full Text
AUTHORS: Martinez, FL; Ruiz Merino, R; del Prado, A; San Andres, E; Martil, I; Gonzalez Diaz, G; Jeynes, C; Barradas, NP ; Wang, L; Reehal, HS;
PUBLISHED: 2004, SOURCE: 8th European Vacuum Congress (EVC-8)/2nd Annual Conference of the German-Vacuum-Society (DVG) in THIN SOLID FILMS, VOLUME: 459, ISSUE: 1-2

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