ProfileOfResearchers

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282

TITLE: Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering Full Text
AUTHORS: Barradas, NP ; Alves, E ; Pereira, S ; Shvartsman, VV; Kholkin, AL ; Pereira, E; O'Donnell, KP; Liu, C; Deatcher, CJ; Watson, IM; Mayer, M;
PUBLISHED: 2004, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 217, ISSUE: 3

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CrossRef: 28

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283

TITLE: Stabilization of ZrO2PVD coatings with Gd2O3 Full Text
AUTHORS: Portinha, A; Teixeira, V ; Carneiro, J ; Costa, MF ; Barradas, NP ; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.

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284

TITLE: A training algorithm for classification of high-dimensional data Full Text
AUTHORS: Vieira, A; Barradas, N ;
PUBLISHED: 2003, SOURCE: NEUROCOMPUTING, VOLUME: 50

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285

TITLE: Advanced data analysis techniques for ion beam analysis Full Text
AUTHORS: Barradas, NP ;
PUBLISHED: 2003, SOURCE: Workshop on Modern Surface Analytical Techniques in SURFACE AND INTERFACE ANALYSIS, VOLUME: 35, ISSUE: 9

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286

TITLE: Artificial neural network analysis of RBS data with roughness: Application to Ti0.4Al0.6N/Mo multilayers Full Text
AUTHORS: Ohl, G; Matias, V; Vieira, A; Barradas, NP ;
PUBLISHED: 2003, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 211, ISSUE: 2

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287

TITLE: Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
AUTHORS: Matias, V; Ohl, G; Soares, JC ; Barradas, NP ; Vieira, A; Cardoso, S ; Freitas, PP ;
PUBLISHED: 2003, SOURCE: PHYSICAL REVIEW E, VOLUME: 67, ISSUE: 4

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288

TITLE: Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
AUTHORS: Matias, V; Öhl, G; Soares, JC; Barradas, NP ; Vieira, A; Cardoso, S; Freitas, PP;
PUBLISHED: 2003, SOURCE: Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics, VOLUME: 67, ISSUE: 4

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289

TITLE: Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Marriott, PK; Boudreault, G; Jenkin, M; Wendler, E; Webb, RP;
PUBLISHED: 2003, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, ISSUE: 7

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290

TITLE: Graded selective coatings based on chromium and titanium oxynitride Full Text
AUTHORS: Nunes, C; Teixeira, V ; Prates, ML; Barradas, NP ; Sequeira, AD;
PUBLISHED: 2003, SOURCE: 4th International Conference on Coatings on Glass in THIN SOLID FILMS, VOLUME: 442, ISSUE: 1-2

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