Elemental Thin Film Depth Profiles by Ion Beam Analysis Using Simulated Annealing - a New Tool

AuthID
 P-000-H33
7
Author(s)
Marriott, PK
·
Boudreault, G
·
Jenkin, M
·
Webb, RP
Document Type
Review
Year published
2003
Published
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 36, Issue: 7, Pages: R97-R126 (30)
Indexing
Wos®
Scopus®
Crossref®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-0345373827
Wos: WOS:000182586400001
Source Identifiers
ISSN: 0022-3727
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