291
TITLE: Magnetic characterization of U/Co multilayers  Full Text
AUTHORS: Rosa, MA; Diego, M; Alves, E ; Barradas, NP ; Godinho, M ; Almeida, M ; Concalves, AP ;
PUBLISHED: 2003, SOURCE: European Conference on Physics of Magnetism in PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, VOLUME: 196, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
292
TITLE: Monte Carlo modeling of the Portuguese Research Reactor core and comparison with experimental measurements
AUTHORS: Fernandes, AC; Goncalves, IC; Barradas, NP ; Ramalho, AJ;
PUBLISHED: 2003, SOURCE: NUCLEAR TECHNOLOGY, VOLUME: 143, ISSUE: 3
INDEXED IN: Scopus WOS
293
TITLE: The influence of in situ photoexcitation on a defect structure generation in Ar+ implanted GaAs(001) crystals revealed by high-resolution x-ray diffraction and Rutherford backscattering spectroscopy  Full Text
AUTHORS: Chtcherbatchev, KD; Bublik, VT; Markevich, AS; Mordkovich, VN; Alves, E ; Barradas, NP ; Sequeira, AD;
PUBLISHED: 2003, SOURCE: X-TOP 2002 Conference in JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, ISSUE: 10A
INDEXED IN: Scopus WOS CrossRef
294
TITLE: Accurate determination of the stopping power of He-4 in Si using Bayesian inference  Full Text
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLISHED: 2002, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 194, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
295
TITLE: Analysis of sapphire implanted with different elements using artificial neural networks  Full Text
AUTHORS: Vieira, A; Barradas, NP ; Alves, E ;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
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296
TITLE: Application of high-resolution X-ray diffraction to study strain status in Si1-xGex/Si1-yGey/Si (001) heterostructures  Full Text
AUTHORS: Chtcherbatchev, KD; Sequeira, AD; Franco, N; Barradas, NP ; Myronov, M; Mironov, OA; Parker, EHC;
PUBLISHED: 2002, SOURCE: 9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX) in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 91
INDEXED IN: Scopus WOS CrossRef
297
TITLE: Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure  Full Text
AUTHORS: Gurbich, AF; Barradas, NP ; Jeynes, C; Wendler, E;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
298
TITLE: Artificial neural networks for automation of Rutherford backscattering spectroscopy experiments and data analysis
AUTHORS: Barradas, NP ; Vieira, A; Patricio, R;
PUBLISHED: 2002, SOURCE: PHYSICAL REVIEW E, VOLUME: 65, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
299
TITLE: Composition analysis of the insulating barrier in magnetic tunnel junctions by grazing angle of incidence RBS  Full Text
AUTHORS: Wei, P; Barradas, NP ; Soares, JC ; da Silva, MF; Kreissig, U; Cardoso, S ; Freitas, PP ;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
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300
TITLE: Degradation of structural and optical properties of InGaN/GaN multiple quantum wells with increasing number of wells  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Barradas, NP ; Sequeira, AD; Franco, N; Watson, IM; Liu, C;
PUBLISHED: 2002, SOURCE: International Workshop on Nitride Semiconductors (IWN 2002) in INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS, PROCEEDINGS, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 3
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