ProfileOfResearchers

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342

TITLE: Processing and characterisation of sol-gel deposited Ta2O5 and TiO2-Ta2O5 dielectric thin films Full Text
AUTHORS: Cappellani, A; Keddie, JL; Barradas, NP ; Jackson, SM;
PUBLISHED: 1999, SOURCE: Symposium on Materials and Processes for Submicron Technologies, at the E-MRS Spring Meeting in SOLID-STATE ELECTRONICS, VOLUME: 43, ISSUE: 6

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343

TITLE: Rapid accurate automated analysis of complex ion beam analysis data
AUTHORS: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475

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344

TITLE: RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering
AUTHORS: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475

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345

TITLE: RES and ERDA study of ion beam synthesised amorphous gallium nitride Full Text
AUTHORS: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4

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346

TITLE: Self ion irradiated Si probed with enhanced depth resolution positron annihilation spectroscopy Full Text
AUTHORS: Knights, AP; Nejim, A; Barradas, NP ; Coleman, PG;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4

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347

TITLE: Simulated annealing analysis of nuclear reaction analysis measurements of polystyrene systems
AUTHORS: Barradas, NP ; Smith, R;
PUBLISHED: 1999, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 32, ISSUE: 22

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348

TITLE: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD Full Text
AUTHORS: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2

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349

TITLE: The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC Full Text
AUTHORS: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4

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350

TITLE: Unambiguous automatic evaluation of multiple Ion Beam Analysis data with Simulated Annealing Full Text
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Kreissig, U; Grotzschel, R;
PUBLISHED: 1999, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 149, ISSUE: 1-2

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