221
TITLE: Growth of microcrystalline beta-SiC films on silicon by ECR plasma CVD  Full Text
AUTHORS: Toal, SJ; Reehal, HS; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: Symposium on Surface Processing - Laser, Lamp, Plasma, at the Annual Spring Meeting of the European-Materials-Society (E-MRS 96) in APPLIED SURFACE SCIENCE, VOLUME: 138, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
222
TITLE: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
AUTHORS: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLISHED: 1999, SOURCE: PHYSICAL REVIEW B, VOLUME: 59, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef
223
TITLE: Processing and characterisation of sol-gel deposited Ta2O5 and TiO2-Ta2O5 dielectric thin films  Full Text
AUTHORS: Cappellani, A; Keddie, JL; Barradas, NP ; Jackson, SM;
PUBLISHED: 1999, SOURCE: Symposium on Materials and Processes for Submicron Technologies, at the E-MRS Spring Meeting in SOLID-STATE ELECTRONICS, VOLUME: 43, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
224
TITLE: Rapid accurate automated analysis of complex ion beam analysis data
AUTHORS: Marriott, PK; Jenkin, M; Jeynes, C; Barradas, NP ; Webb, RP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXED IN: WOS
225
TITLE: RBS/simulated annealing and FTIR characterisation of BCN films deposited by dual cathode magnetron sputtering
AUTHORS: Barradas, NP ; Jeynes, C; Kusano, Y; Evetts, JE; Hutchings, IM;
PUBLISHED: 1999, SOURCE: 15th International Conference on the Application of Accelerators in Research and Industry in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY, PTS 1 AND 2, VOLUME: 475
INDEXED IN: WOS
226
TITLE: RES and ERDA study of ion beam synthesised amorphous gallium nitride  Full Text
AUTHORS: Barradas, NP ; Almeida, SA; Jeynes, C; Knights, AP; Silva, SRP; Sealy, BJ;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
227
TITLE: Self ion irradiated Si probed with enhanced depth resolution positron annihilation spectroscopy  Full Text
AUTHORS: Knights, AP; Nejim, A; Barradas, NP ; Coleman, PG;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
228
TITLE: Simulated annealing analysis of nuclear reaction analysis measurements of polystyrene systems
AUTHORS: Barradas, NP ; Smith, R;
PUBLISHED: 1999, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 32, ISSUE: 22
INDEXED IN: Scopus WOS CrossRef
229
TITLE: Structural analysis of nanocrystalline SiC thin films grown on silicon by ECR plasma CVD  Full Text
AUTHORS: Toal, SJ; Reehal, HS; Webb, SJ; Barradas, NP ; Jeynes, C;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
230
TITLE: The influence of implantation and annealing conditions on optical activity of Er3+ ions in 6H SiC  Full Text
AUTHORS: Kozanecki, A; Jeynes, C; Barradas, NP ; Sealy, BJ; Jantsch, W;
PUBLISHED: 1999, SOURCE: 11th International Conference on Ion Beam Modification of Materials (IBMM98) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 148, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
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