António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



51
TITLE: Cross-correlation and sine-fitting techniques for high resolution ultrasonic ranging  Full Text
AUTHORS: Queiros, R; Girao, PS; Cruz C Serra ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
52
TITLE: Cross-correlation and sine-fitting techniques for high resolution ultrasonic ranging  Full Text
AUTHORS: Queiros, R; Girao, PS; Serra, AC ;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
53
TITLE: Fast ADC testing by repetitive histogram analysis  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Michaeli, L; Michalko, P; Saliga, J;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
54
TITLE: Fast ADC testing by repetitive histogram analysis  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Michaeli, L; Michalko, P; Saliga, J;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
55
TITLE: On the static test of analogue-to-digital converters  Full Text
AUTHORS: Antonio Cruz Serra ;
PUBLISHED: 2006, SOURCE: 49th IEEE International Midwest Symposium on Circuits and Systems in IEEE MWSCAS'06: PROCEEDINGS OF THE 2006 49TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL II, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
56
TITLE: Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals
AUTHORS: Ramos, PM ; da Silva, MF; Martins, RC ; Serra, AMC ;
PUBLISHED: 2006, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 55, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
57
TITLE: The histogram test of ADCs is unbiased by phase noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
58
TITLE: The histogram test of ADCs is unbiased by phase noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
59
TITLE: Uncertainty of estimates obtained with the histogram test of ADCS
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2006, SOURCE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
INDEXED IN: Scopus
IN MY: ORCID
60
TITLE: Uncertainty of the estimates of sine wave fitting of digital data in the presence of additive noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
Page 6 of 13. Total results: 125.

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