Publications

Fast Adc Testing by Repetitive Histogram Analysis

AuthID
P-00F-HPE

Author(s)

Serra, AC

Alegria, F

Michaeli, L

Michalko, P

Saliga, J

Document Type

Proceedings Paper

Year published

2006

Published

in Conference Record - IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281

Pages: 1633-1638

Conference

Imtc'06 - Ieee Instrumentation and Measurement Technology Conference, Date: 24 April 2006 through 27 April 2006, Location: Sorrento, Sponsors: IEEE Instrumentation and Measurement Society

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Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/imtc.2006.237120

Scopus: 2-s2.0-36048965820

Source Identifiers

ISSN: 1091-5281

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