Cristina Maria Gonçalves Santos Louro


AuthID: R-000-3ZQ

Confirmed Publications: 29



11
TITLE: Thermal behaviour of hard nanocomposite coatings within the W-Si-N system in oxidant and protective atmospheres  Full Text
AUTHORS: Cavaleiro, A ; Louro, C ;
PUBLISHED: 2007, SOURCE: International Conference on Superhard Coatings in SURFACE & COATINGS TECHNOLOGY, VOLUME: 201, ISSUE: 13
INDEXED IN: Scopus WOS CrossRef: 8
IN MY: ORCID
12
TITLE: W-B-N sputter-deposited thin films for mechanical application  Full Text
AUTHORS: Louro, C ; Lamni, R; Levy, F;
PUBLISHED: 2005, SOURCE: 9th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
13
TITLE: Hardness evaluation of W-Si-N sputtered coatings after thermal degradation  Full Text
AUTHORS: Louro, C ;
PUBLISHED: 2004, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
14
TITLE: Effect of the substrate thermal expansion coefficient on the thermal residual stresses in W-Si-N sputtered films
AUTHORS: Louro, C ; Teixeira Dias, F ; Menezes, LF ; Cavaleiro, A ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS
IN MY: ORCID
15
TITLE: Influence of heat treatment on the structure of W-Si-N sputtered films
AUTHORS: Ferreira, L; Louro, C ; Cavaleiro, A ; Trindade, B ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS
IN MY: ORCID
16
TITLE: Nanocrystalline structure and hardness of thin films  Full Text
AUTHORS: Cavaleiro, A ; Louro, C ;
PUBLISHED: 2002, SOURCE: 4th Iberian Vacuum Meeting (IVM-4) in VACUUM, VOLUME: 64, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef: 32
IN MY: ORCID
17
TITLE: Oxidation behaviour of (TiAl)-based intermetallics doped with silver
AUTHORS: Ramos, AS ; Vieira, MT ; Louro, C ; Cavaleiro, A ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS
IN MY: ORCID
18
TITLE: The depth profile analysis of W-Si-N coatings after thermal annealing  Full Text
AUTHORS: Louro, C ; Cavaleiro, A ; Dub, S; Smid, P; Musil, J; Vlcek, J;
PUBLISHED: 2002, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 161, ISSUE: 2-3
INDEXED IN: Scopus WOS CrossRef: 11
IN MY: ORCID
19
TITLE: How is the chemical bonding of W-Si-N sputtered coatings?  Full Text
AUTHORS: Louro, C ; Cavaleiro, A ; Montemor, F ;
PUBLISHED: 2001, SOURCE: 7th International Conference on Plasma Surface Engineering (PSE 2000) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 142
INDEXED IN: Scopus WOS CrossRef: 28
IN MY: ORCID
20
TITLE: Mechanical behaviour of amorphous W-Si-N sputtered films after thermal annealing at increasing temperatures  Full Text
AUTHORS: Louro, C ; Cavaleiro, A ;
PUBLISHED: 2000, SOURCE: 26th International Conference on Metallurgical Coating and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 123, ISSUE: 2-3
INDEXED IN: Scopus WOS CrossRef: 21
IN MY: ORCID
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