Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 904



221
TITLE: Raman study of insulating and conductive ZnO:(Al, Mn) thin films. Raman study of insulating and conductive ZnO:(Al, Mn) thin films  Full Text
AUTHORS: Cerqueira, MF ; Viseu, T ; de Campos, JA; Rolo, AG ; de Lacerda Aroso, T ; Oliveira, F; Bogdanovic Radovic, I; Alves, E ; Vasilevskiy, MI ;
PUBLISHED: 2015, SOURCE: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 212, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID | CIÊNCIAVITAE
222
TITLE: Retention behaviour of deuterium and helium in beryllium under single D+ and dual He+/D+ exposure  Full Text
AUTHORS: Mateus, R; Franco, N; Alves, E ;
PUBLISHED: 2015, SOURCE: 28th Symposium on Fusion Technology (SOFT) in FUSION ENGINEERING AND DESIGN, VOLUME: 98-99
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
223
TITLE: Single and dual ion implantation of c:Si with Fe+ and C+: microstructural characterization
AUTHORS: Nunes, B; Alves, E ; Colaço, R;
PUBLISHED: 2015, SOURCE: Microscopy and Microanalysis, VOLUME: 21, ISSUE: S6
INDEXED IN: CrossRef
IN MY: ORCID | CIÊNCIAVITAE
224
TITLE: Solar selective absorbers based on Al2O3:W cermets and AlSiN/AlSiON layers  Full Text
AUTHORS: Rebouta, L ; Sousa, A; Capela, P; Andritschky, M ; Santilli, P; Matilainen, A; Pischow, K; Barradas, NP ; Alves, E ;
PUBLISHED: 2015, SOURCE: SOLAR ENERGY MATERIALS AND SOLAR CELLS, VOLUME: 137
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
225
TITLE: Spectroscopic Analysis of Eu3+ Implanted and Annealed GaN Layers and Nanowires
AUTHORS: Rodrigues, J; Leitao, MF; Carreira, JFC; Ben Sedrine, N; Santos, NF; Felizardo, M ; Auzelle, T; Daudin, B; Alves, E ; Neves, AJ; Correia, MR; Costa, FM; Lorenz, K ; Monteiro, T ;
PUBLISHED: 2015, SOURCE: JOURNAL OF PHYSICAL CHEMISTRY C, VOLUME: 119, ISSUE: 31
INDEXED IN: Scopus WOS CrossRef: 6
IN MY: ORCID | CIÊNCIAVITAE
226
TITLE: Structural characterization of dual ion implantation in silicon  Full Text
AUTHORS: Nunes, B; Franco, N; Botelho do Rego, AMB; Alves, E ; Colaco, R ;
PUBLISHED: 2015, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 365
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
227
TITLE: Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputtering  Full Text
AUTHORS: Cristea, D; Crisan, A; Cretu, N; Borges, J ; Lopes, C; Cunha, L ; Ion, V; Dinescu, M; Barradas, NP ; Alves, E ; Apreutesei, M; Munteanu, D;
PUBLISHED: 2015, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 354
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
228
TITLE: Study of the electrical behavior of nanostructured Ti-Ag thin films, prepared by Glancing Angle Deposition  Full Text
AUTHORS: Lopes, C; Pedrosa, P; Martin, N; Barradas, NP ; Alves, E ; Vaz, F ;
PUBLISHED: 2015, SOURCE: MATERIALS LETTERS, VOLUME: 157
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
229
TITLE: The effect of metal-rich growth conditions on the microstructure of ScxGa1-xN films grown using molecular beam epitaxy. Effect of metal-rich growth conditions on the microstructure of ScxGa1−xN films  Full Text
AUTHORS: Tsui, HCL; Goff, LE; Barradas, NP ; Alves, E ; Pereira, S; Beere, HE; Farrer, I; Nicoll, CA; Ritchie, DA; Moram, MA;
PUBLISHED: 2015, SOURCE: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 212, ISSUE: 12
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
230
Page 23 of 91. Total results: 904.

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