651
TITLE: Analysis of nanolayered samples with a He-4 beam  Full Text
AUTHORS: Franco, N; Gouveia, JAA; Alves, E ; Cardoso, S ; Freitas, PP ; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
652
TITLE: Annealing properties of ZnO films grown using diethyl zinc and tertiary butanol  Full Text
AUTHORS: Wang, JZ; Peres, M; Soares, J; Gorochov, O; Barradas, NP ; Alves, E ; Lewis, JE; Fortunato, E ; Neves, A ; Monteiro, T ;
PUBLISHED: 2005, SOURCE: JOURNAL OF PHYSICS-CONDENSED MATTER, VOLUME: 17, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef Handle
654
TITLE: Beyond single scattering off flat samples  Full Text
AUTHORS: Barradas, NP ; Fonseca, A; Franco, N; Alves, E ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
655
TITLE: Characterization and stability studies of titanium beryllides  Full Text
AUTHORS: Alves, E ; Alves, LC ; Franco, N; da Silva, MR ; Paul, A; Hegeman, JB; Druyts, F;
PUBLISHED: 2005, SOURCE: 23rd Symposium on Fusion Technology (SOFT 23) in FUSION ENGINEERING AND DESIGN, VOLUME: 75-79, ISSUE: SUPPL.
INDEXED IN: Scopus WOS CrossRef
656
TITLE: Characterization of silicon carbide thin films and their use in colour sensor  Full Text
AUTHORS: Zhang, S; Raniero, L; Fortunato, E ; Liao, X; Hu, Z; Ferreira, I ; Aguas, H ; Ramos, AR ; Alves, E ; Martins, R ;
PUBLISHED: 2005, SOURCE: International Conference on Physics, Chemistry and Engineering of Solar Cells in SOLAR ENERGY MATERIALS AND SOLAR CELLS, VOLUME: 87, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
657
TITLE: Comment on "Direct evidence of nanocluster-induced luminescence in InGaN epifilms" [Appl. Phys. Lett. 86, 021911 (2005)]  Full Text
AUTHORS: Pereira, S; Correia, MR ; Alves, E ; O'Donnell, KP; Chang, HJ; Chen, CH; Chen, YF; Lin, TY; Chen, LC; Chen, KH; Lan, ZH;
PUBLISHED: 2005, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 87, ISSUE: 13
INDEXED IN: Scopus WOS CrossRef: 2
658
TITLE: Compositional and structural characterisation of GaSb and GaInSb  Full Text
AUTHORS: Corregidor, V ; Alves, E ; Alves, LC ; Barradas, NP ; Duffar, T; Franco, N; Marques, C; Mitric, A;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
659
TITLE: Damage formation and annealing at low temperatures in ion implanted ZnO  Full Text
AUTHORS: Lorenz, K ; Alves, E ; Wendler, E; Bilani, O; Wesch, W; Hayes, M;
PUBLISHED: 2005, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 87, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef
660
TITLE: Detection angle resolved PIXE and the equivalent depth concept for thin film characterization  Full Text
AUTHORS: Miguel A. Reis ; Chaves, PC ; Corregidor, V ; Barradas, NP ; Alves, E ; Dimroth, F; Bett, AW;
PUBLISHED: 2005, SOURCE: 10th PIXE Conference in X-RAY SPECTROMETRY, VOLUME: 34, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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