Detection Angle Resolved Pixe and the Equivalent Depth Concept for Thin Film Characterization

AuthID
P-000-2S6
7
Author(s)
Dimroth, F
·
Bett, AW
Document Type
Article
Year published
2005
Published
in X-RAY SPECTROMETRY, ISSN: 0049-8246
Volume: 34, Issue: 4, Pages: 372-375 (4)
Conference
10Th Pixe Conference, Date: JUN 04-08, 2004, Location: Portoroz, SLOVENIA
Indexing
Publication Identifiers
Scopus: 2-s2.0-22544444638
Wos: WOS:000230500800023
Source Identifiers
ISSN: 0049-8246
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