1
TITLE: Aging and Performance Sensor for SRAM
AUTHORS: Santos, H; Jorge Semião ; Cabral, R; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
SOURCE: 31st Conference on Design of Circuits and Integrated Systems (DCIS) in 2016 CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS 2016), PUBLISHED: 2016
INDEXED IN: Scopus WOS CrossRef
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2
TITLE: Integration of a Real-Time Stochastic Routing Optimization Software with an Enterprise Resource Planner
AUTHORS: Pedro J S Cardoso ; Gabriela Schuetz ; Jorge Semião ; Janio Monteiro ; Joao Rodrigues ; Andriy Mazayev ; Emanuel Ey; Micael Viegas;
SOURCE: 1st International Conference on Geographical Information Systems Theory, Applications and Management (GISTAM) in GEOGRAPHICAL INFORMATION SYSTEMS THEORY, APPLICATIONS AND MANAGEMENT, GISTAM 2015, VOLUME: 582, PUBLISHED: 2016
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
3
TITLE: Fast Radiation Monitoring in FPGA-based Designs
AUTHORS: Leong, C; Jorge Semião ; Santos, MB; Teixeira, IC; Teixeira, JP; Batista, AJN; Goncalves, B; Marques, JG;
SOURCE: 2015 Conference on Design of Circuits and Integrated Systems (DCIS) in 2015 Conference on Design of Circuits and Integrated Systems (DCIS), PUBLISHED: 2015
INDEXED IN: Scopus WOS
IN MY: ORCID
4
TITLE: Fast radiation monitoring in FPGA-based designs
AUTHORS: Leong, C; Jorge Semião ; M.B Santos; I.C Teixeira; J.P Teixeira; A.J.N Batista; Goncalves, B; J.G Marques;
SOURCE: 2015 Conference on Design of Circuits and Integrated Systems (DCIS), PUBLISHED: 2015
INDEXED IN: CrossRef
IN MY: ORCID
5
TITLE: Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage and Frequency Scaling
AUTHORS: Leong, C; Jorge Semião ; Santos, MB; Teixeira, IC; Teixeira, JP;
SOURCE: JOURNAL OF LOW POWER ELECTRONICS, VOLUME: 11, ISSUE: 4, PUBLISHED: 2015
INDEXED IN: Scopus WOS CrossRef
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6
TITLE: Fault-Tolerance in FPGA Focusing Power Reduction or Performance Enhancement
AUTHORS: Leong, C; Jorge Semião ; Santos, MB; Teixeira, IC; Teixeira, JP;
SOURCE: 16th IEEE Latin American Test Symposium (LATS) in 2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS), PUBLISHED: 2015
INDEXED IN: Scopus WOS CrossRef
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7
TITLE: Aging-aware dynamic voltage or frequency scaling
AUTHORS: Jorge Semião ; Leong, C; Romao, A; Santos, MB; Teixeira, IC; Teixeira, JP;
SOURCE: 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014 in Proceedings of the 2014 29th Conference on Design of Circuits and Integrated Systems, DCIS 2014, PUBLISHED: 2014
INDEXED IN: Scopus CrossRef
IN MY: ORCID
8
TITLE: AGING MONITORING WITH LOCAL SENSORS IN FPGA-BASED DESIGNS
AUTHORS: Leong, C; Jorge Semião ; Teixeira, IC; Santos, MB; Teixeira, JP; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
SOURCE: 23rd International Conference on Field Programmable Logic and Applications (FPL) in 2013 23RD INTERNATIONAL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS (FPL 2013) PROCEEDINGS, PUBLISHED: 2013
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
9
TITLE: Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
AUTHORS: Maria D Valdes Pena; Judit F Fernandez Freijedo; Maria J M Moure Rodriguez; Juan J Rodriguez Andina; Jorge Semião ; Isabel Maria C Cacho Teixeira ; Joao Paulo C Cacho Teixeira ; Fabian Vargas;
SOURCE: IEEE TRANSACTIONS ON NANOTECHNOLOGY, VOLUME: 12, ISSUE: 4, PUBLISHED: 2013
INDEXED IN: Scopus WOS CrossRef
10
TITLE: Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion  Full Text
AUTHORS: Vazquez, JC; Champac, V; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 29, ISSUE: 3, PUBLISHED: 2013
INDEXED IN: Scopus WOS CrossRef
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