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Jorge Filipe Leal Costa Semião
AuthID:
R-001-F67
Publications
Confirmed
To Validate
Document Source:
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Document Type:
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Proceedings Paper (55)
Article (12)
Book Chapter (10)
Book (3)
Review (1)
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Confirmed Publications: 81
61
TITLE:
Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies
Full Text
AUTHORS:
Jorge Semião
;
Freijedo, J
; Rodriguez Andina, J;
Vargas, F
;
Santos, M
;
Teixeira, I
;
Teixeira, P
;
PUBLISHED:
2009
,
SOURCE:
15th IEEE International On-Line Testing Symposium
in
2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
62
TITLE:
Measuring Clock-Signal Modulation Efficiency for Systems-on-Chip in Electromagnetic Interference Environment
AUTHORS:
Jorge Semião
;
Freijedo, J
; Moraes, M; Mallmann, M;
Antunes, C
; Benfica, J;
Vargas, F
;
Santos, M
;
Teixeira, IC
; Rodriguez Andina, JJR;
Teixeira, JP
; Lupi, D; Gatti, E;
Garcia, L
; Hernandez, F;
PUBLISHED:
2009
,
SOURCE:
10th Latin American Test Workshop
in
LATW: 2009 10TH LATIN AMERICAN TEST WORKSHOP
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
63
TITLE:
Delay modeling for power noise and temperature-aware design and test of digital systems
AUTHORS:
Freijedo, JF
;
Jorge Semião
; Rodriguez Andina, JJ;
Vargas, F
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2008
,
SOURCE:
Journal of Low Power Electronics,
VOLUME:
4,
ISSUE:
3
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
64
TITLE:
Exploiting parametric power supply and/or temperature variations to improve fault tolerance in digital circuits
AUTHORS:
Jorge Semião
;
Freijedo, J
;
Andina, J
;
Vargas, F
;
Santos, M
;
Teixeira, I
;
Teixeira, P
;
PUBLISHED:
2008
,
SOURCE:
14th IEEE International On-Line Testing Symposium
in
14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
65
TITLE:
Power-Supply Instability Aware Clock Signal Modulation for Digital Integrated Circuits
AUTHORS:
Jorge Semião
;
Freijedo, J
; Moraes, M; Mallmann, M;
Antunes, C
; Rocha, L; Benfica, J;
Vargas, F
;
Santos, M
;
Teixeira, IC
; Rodriguez Andina, JJR;
Teixeira, JP
;
Lupi, D
; Gatti, E;
Garcia, L
; Hernandez, F;
PUBLISHED:
2008
,
SOURCE:
International Symposium on Electromagnetic Compatibility
in
2008 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC EUROPE)
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
66
TITLE:
Process tolerant design using thermal and power-supply tolerance in pipeline based circuits
AUTHORS:
Jorge Semião
; Rodriguez Andina, JJ; Vargas, F;
Santos, M
;
Teixeira, I
;
Teixeira, P
;
PUBLISHED:
2008
,
SOURCE:
11th IEEE International Workshop on Design and Diagnostics of Electronic Circuits and Systems
in
2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
67
TITLE:
Robust Solution for Synchronous Communication among Multi Clock Domains
AUTHORS:
Jorge Semião
;
Varela, J
;
Freijedo, J
; Andina, J;
Leong, C
;
Teixeira, JP
;
Teixeira, I
;
PUBLISHED:
2008
,
SOURCE:
IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008)
in
2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
68
TITLE:
Signal integrity enhancement in digital circuits
Full Text
AUTHORS:
Jorge Semião
; Marcial Jesus R Rodriguez Irago; Juan J Rodriguez Andina; Leonardo Bisch Piccoli;
Fabian Luis Vargas
;
Marcelino Bicho dos Santos
;
Isabel Maria C Cacho Teixeira
;
Joao Paulo Teixeira
;
PUBLISHED:
2008
,
SOURCE:
IEEE DESIGN & TEST OF COMPUTERS,
VOLUME:
25,
ISSUE:
5
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
69
TITLE:
Time Management for Low-Power Design of Digital Systems
AUTHORS:
Jorge Semião
;
Freijedo, JF
; Rodriguez Andina, JJ;
Vargas, F
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2008
,
SOURCE:
Journal of Low Power Electronics,
VOLUME:
4,
ISSUE:
3
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
70
TITLE:
Enhancing the tolerance to power-supply instability in digital circuits
AUTHORS:
Jorge Semião
;
Freijedo, J
;
Rodriguez J R Andina
;
Vargas, F
;
Santos, MB
;
Teixeira, IC
;
Teixeira, JP
;
PUBLISHED:
2007
,
SOURCE:
IEEE-Computer-Society Annual Symposium on VLSI
in
IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: EMERGING VLSI TECHNOLOGIES AND ARCHITECTURES
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
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