Jorge Filipe Leal Costa Semião


AuthID: R-001-F67

Confirmed Publications: 84



81
TITLE: Quality of electronic design: from architectural level to test coverage
AUTHORS: O.P Dias; M.B Santos; J.P Teixeira; Jorge Semião ; I.M Teixeira;
PUBLISHED: 2002, SOURCE: Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
INDEXED IN: CrossRef: 3
IN MY: ORCID | CIÊNCIAVITAE
82
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
83
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
84
TITLE: Hardware/software specification, design and test using a system level approach
AUTHORS: DIas, OP; Jorge Semião ; Pereira, CE; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 12th Brazilian Symposium on Integrated Circuits and Systems Design, SBCCI 1999 in Proceedings - 12th Symposium on Integrated Circuits and Systems Design, SBCCI 1999
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
Page 9 of 9. Total results: 84.

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