Helena Maria dos Santos Geirinhas Ramos


AuthID: R-000-5TB

Confirmed Publications: 158



81
TITLE: Measuring interface for an ECT System
AUTHORS: Helena Geirinhas Ramos ; Artur Lopes Ribeiro; Michal Kubinyi;
PUBLISHED: 2011, SOURCE: PRZEGLAD ELEKTROTECHNICZNY, VOLUME: 87, ISSUE: 7
INDEXED IN: WOS
82
TITLE: Measuring interface for an ECT system [Interfejs pomiarowy w systemie wykorzystuja{ogonek}cym pra{ogonek}dy wirowe]
AUTHORS: Ramos, HG ; Ribeiro, AL ; Kubinyi, M;
PUBLISHED: 2011, SOURCE: Przeglad Elektrotechniczny, VOLUME: 87, ISSUE: 7
INDEXED IN: Scopus
IN MY: ORCID
83
TITLE: Modeling eddy current inspection of a metallic sample with round hole defects
AUTHORS: Ramos, HG ; Ribeiro, AL; Posadas, D; Rocha, T;
PUBLISHED: 2011, SOURCE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
INDEXED IN: Scopus
84
TITLE: Portable eddy current NDT instrument using two different implementations
AUTHORS: Pasadas, D; Rocha, T; Ramos, H ; Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: International Conference on Computer as a Tool, EUROCON 2011 - Joint with Conftele 2011 in EUROCON 2011 - International Conference on Computer as a Tool - Joint with Conftele 2011
INDEXED IN: Scopus CrossRef
IN MY: ORCID
85
TITLE: Thickness measurement of a nonmagnetic metallic plate using harmonic eddy current excitation and a GMR sensor
AUTHORS: Ribeiro, AL; Ramos, HG ; Arez, JC;
PUBLISHED: 2011, SOURCE: 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011 in 18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
INDEXED IN: Scopus
86
TITLE: Thickness Measurement Using Transient Eddy Current Techniques  Full Text
AUTHORS: Kral, J; Smid, R; Geirnhas Ramos, HMG ; Lopes Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
87
TITLE: Eddy Current Image Normalization in NDT of Aluminum Plates  Full Text
AUTHORS: Luka Kufrin; Lopes Ribeiro, AL ; Ramos, HG ;
PUBLISHED: 2010, SOURCE: International Instrumentation and Measurement Technology Conference (I2MTC) in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
88
TITLE: Eddy current image normalization in non-destructive testing
AUTHORS: Kufrin, L; Ribeiro, AL; Ramos, HMG ;
PUBLISHED: 2010, SOURCE: 7th International Conference on Condition Monitoring and Machinery Failure Prevention Technologies 2010, CM 2010/MFPT 2010 in 7th International Conference on Condition Monitoring and Machinery Failure Prevention Technologies 2010, CM 2010/MFPT 2010, VOLUME: 2
INDEXED IN: Scopus
89
TITLE: Experiment and simulation of the eddy current NDT on an aluminium plate using a uniform field probe
AUTHORS: Kufrin, L; Ribeiro, AL ; Ramos, HG ; Postolache, O ;
PUBLISHED: 2010, SOURCE: 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements in 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN: Scopus
IN MY: ORCID
90
TITLE: Image Analysis for Crack Detection  Full Text
AUTHORS: Luka Kufrin; Postolache, O ; Lopes L Ribeiro ; Geirinhas M G Ramos ;
PUBLISHED: 2010, SOURCE: International Instrumentation and Measurement Technology Conference (I2MTC) in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID | ResearcherID
Page 9 of 16. Total results: 158.

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