Helena Maria dos Santos Geirinhas Ramos
AuthID: R-000-5TB
1
TITLE: An Eddy Current Probe With Minimum Background Magnetic Field for the Detection of Deeply Buried Defects Full Text
AUTHORS: Xie, Lian; Baskaran, Prashanth; Feng, Bo; Pasadas, Dario Jeronimo; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 25, ISSUE: 12
AUTHORS: Xie, Lian; Baskaran, Prashanth; Feng, Bo; Pasadas, Dario Jeronimo; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 25, ISSUE: 12
2
TITLE: Pulse-Echo and Pitch-Catch: Ultrasonic C-Scan of Adhesively Bonded Single Lap-joints
AUTHORS: Barzegar, Mohsen; Pasadas, Dario J.; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2023, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Rising Above Covid-19 in 2023 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC, VOLUME: 2023-May
AUTHORS: Barzegar, Mohsen; Pasadas, Dario J.; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2023, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Rising Above Covid-19 in 2023 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC, VOLUME: 2023-May
INDEXED IN: 
Scopus 
WOS
Scopus WOS3
TITLE: TC-01: Nondestructive Evaluation and Industrial Inspection (NDE&II) Full Text
AUTHORS: Smith, James A.; Ramos, Helena Geirinhas;
PUBLISHED: 2023, SOURCE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 26, ISSUE: 6
AUTHORS: Smith, James A.; Ramos, Helena Geirinhas;
PUBLISHED: 2023, SOURCE: IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE, VOLUME: 26, ISSUE: 6
INDEXED IN: WOS
WOS4
TITLE: Guided Lamb wave tomography using angle beam transducers and inverse Radon transform for crack image reconstruction Full Text
AUTHORS: Pasadas, Dario J.; Barzegar, Mohsen; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2022, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2022 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC 2022)
AUTHORS: Pasadas, Dario J.; Barzegar, Mohsen; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2022, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2022 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC 2022)
INDEXED IN: Scopus WOS
Scopus WOS5
TITLE: Semi-Analytical Modelling of Perturbations in Magnetic Flux Density due to Narrow Flaws in Eddy Current NDT
AUTHORS: Prashanth Baskaran; Dario J Pasadas; Artur L Ribeiro; Helena G Ramos;
PUBLISHED: 2021, SOURCE: 11th International Workshop NDT in Progress
AUTHORS: Prashanth Baskaran; Dario J Pasadas; Artur L Ribeiro; Helena G Ramos;
PUBLISHED: 2021, SOURCE: 11th International Workshop NDT in Progress
INDEXED IN: Scopus
Scopus6
TITLE: Classification Functions and Optimization Algorithms for Debonding Detection in Adhesively Bonded Lap-joints through Ultrasonic Guided Waves
AUTHORS: Barzegar, Mohsen; Pasadas, Dario J.; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2021, SOURCE: IEEE UFFC Latin America Ultrasonics Symposium (LAUS) in 2021 IEEE UFFC LATIN AMERICA ULTRASONICS SYMPOSIUM (LAUS)
AUTHORS: Barzegar, Mohsen; Pasadas, Dario J.; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2021, SOURCE: IEEE UFFC Latin America Ultrasonics Symposium (LAUS) in 2021 IEEE UFFC LATIN AMERICA ULTRASONICS SYMPOSIUM (LAUS)
INDEXED IN: Scopus WOS
Scopus WOS7
TITLE: Locating and Imaging Impact Damage with an Integrated System of PZT and Eddy Current Probe
AUTHORS: Bo Feng; Dario J Pasadas; Artur L Ribeiro; Helena G Ramos;
PUBLISHED: 2019, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2019 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Bo Feng; Dario J Pasadas; Artur L Ribeiro; Helena G Ramos;
PUBLISHED: 2019, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2019 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
INDEXED IN: WOS
WOS