José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 102



91
TITLE: Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
AUTHORS: José Machado da Silva ; José Silva Matos; Ian M Bell; Gaynor E Taylor;
PUBLISHED: 1996, SOURCE: J. Electron. Test., VOLUME: 9, ISSUE: 1-2
INDEXED IN: DBLP
IN MY: DBLP
92
TITLE: Supply current test of analogue and mixed signal circuits
AUTHORS: Bell, IM; Spinks, SJ; daSilva, JM ;
PUBLISHED: 1996, SOURCE: IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, VOLUME: 143, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 21
IN MY: ORCID | CIÊNCIAVITAE
93
TITLE: Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS: daSilva, JM ; Matos, JS ; Bell, IM; Taylor, GE;
PUBLISHED: 1996, SOURCE: 38th Midwest Symposium on Circuits and Systems in 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2
INDEXED IN: WOS
IN MY: ORCID | CIÊNCIAVITAE
94
TITLE: CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOG CIRCUITS
AUTHORS: DASILVA, JM ; MATOS, JS; BELL, IM; TAYLOR, GE;
PUBLISHED: 1995, SOURCE: ELECTRONICS LETTERS, VOLUME: 31, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID | CIÊNCIAVITAE
95
TITLE: Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS: Machado M da Silva ; Silva S Matos ; Bell Ian, M; Taylor Gaynor, E;
PUBLISHED: 1995, SOURCE: Proceedings of the 1995 IEEE 38th Midwest Symposium on Circuits and Systems. Part 1 (of 2) in Midwest Symposium on Circuits and Systems, VOLUME: 2
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
96
TITLE: An Approach to Testability Improvement of Mixed-Signal Boards
AUTHORS: José Silva Matos; João Canas Ferreira ; Ana C Leão; José Machado da Silva ;
PUBLISHED: 1994, SOURCE: 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30 - June 2, 1994
INDEXED IN: DBLP
IN MY: DBLP
97
TITLE: AN IC ARCHITECTURE FOR BOARD-LEVEL MIXED-SIGNAL TEST SUPPORT
AUTHORS: FERREIRA, JC ; LEAO, AC; DASILVA, JM ; MATOS, JS;
PUBLISHED: 1994, SOURCE: 7th Mediterranean Electrotechnical Conference (MeleCON 94) in 7TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1-3, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
98
TITLE: Approach to testability improvement of mixed-signal boards
AUTHORS: Matos Jose, S; Ferreira Joao, C ; Leao Ana, C; Silva Jose, M ;
PUBLISHED: 1994, SOURCE: Proceedings of the 1994 IEEE International Symposium on Circuits and Systems. Part 3 (of 6) in Proceedings - IEEE International Symposium on Circuits and Systems, VOLUME: 6
INDEXED IN: Scopus
IN MY: ORCID | CIÊNCIAVITAE
99
TITLE: Architecture of test support ICs for mixed-signal testing
AUTHORS: Matos Jose, S; Ferreira Joao, C ; Leao Ana, C; Silva Jose, M ;
PUBLISHED: 1994, SOURCE: Proceedings of the 12th IEEE VLSI Test Symposium in Proceedings of the IEEE VLSI Test Symposium
INDEXED IN: Scopus
IN MY: ORCID | CIÊNCIAVITAE
100
TITLE: Architecture of test support ICs for mixed-signal testing
AUTHORS: José Silva Matos; João Canas Ferreira ; Ana C Leão; Machado M Silva ;
PUBLISHED: 1994, SOURCE: 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA
INDEXED IN: DBLP
IN MY: DBLP
Page 10 of 11. Total results: 102.

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