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Katharina Lorenz
AuthID:
R-000-90E
Publications
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Document Source:
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Document Type:
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Article (106)
Proceedings Paper (22)
Review (1)
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Confirmed Publications: 129
101
TITLE:
Optical properties of high-temperature annealed Eu-implanted GaN
Full Text
AUTHORS:
Wang, K;
Martin, RW
; Nogales, E; Katchkanov, V; O'Donnell, KP; Hernandez, S;
Lorenz, K
;
Alves, E
;
Ruffenach, S
; Briot, O;
PUBLISHED:
2006
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
102
TITLE:
Rare earth ion implantation in GaN: Damage formation and recovery
AUTHORS:
Gloux, F; Ruterana, P; Wojtowicz, T;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
35th International School on the Physics of Semiconducting Compounds
in
ACTA PHYSICA POLONICA A,
VOLUME:
110,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
103
TITLE:
Structure and role of ultrathin AlN layers for improving optical activation of rare earth implanted GaN
Full Text
AUTHORS:
Wojtowicz, T
;
Gloux, F
;
Ruterana, P
;
Nouet, G
; Bodiou, L; Braud, A;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
6th International Conference on Nitride Semiconductors (ICNS-6)
in
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
VOLUME:
243,
ISSUE:
7
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
104
TITLE:
TEM investigation of Tm implanted GaN, the influence of high temperature annealing
Full Text
AUTHORS:
Wojtowicz, T; Gloux, F; Ruterana, P;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
105
TITLE:
The structure of crystallographic damage in GaN formed during rare earth ion implantation with and without an ultrathin AlN capping layer
Full Text
AUTHORS:
Gloux, F
;
Ruterana, P
;
Wojtowicz, T
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
106
TITLE:
Transmission electron microscopy investigation of the structural damage formed in GaN by medium range energy rare earth ion implantation
Full Text
AUTHORS:
Gloux, F
;
Wojtowicz, T
;
Ruterana, P
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
100,
ISSUE:
7
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
107
TITLE:
UV-Raman scattering study of lattice recovery by thermal annealing of Eu+-implanted GaN layers
Full Text
AUTHORS:
Pastor, D
; Hernandez, S; Cusco, R; Artus, L;
Martin, RW
; O'Donnell, KP; Briot, O;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
108
TITLE:
Damage formation and annealing at low temperatures in ion implanted ZnO
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
;
Wendler, E
; Bilani, O; Wesch, W; Hayes, M;
PUBLISHED:
2005
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
87,
ISSUE:
19
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
109
TITLE:
Selectively excited photoluminescence from Eu-implanted GaN
Full Text
AUTHORS:
Wang, K;
Martin, RW
; O'Donnell, KP; Katchkanov, V; Nogales, E;
Lorenz, K
;
Alves, E
;
Ruffenach, S
; Briot, O;
PUBLISHED:
2005
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
87,
ISSUE:
11
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
110
TITLE:
The atomic structure of defects formed during doping of GaN with rare earth ions
Full Text
AUTHORS:
Wojtowicz, T
;
Ruterana, P
;
Lorenz, K
;
Wahl, U
;
Alves, E
;
Ruffenach, S
; Halambalakis, G; Briot, O;
PUBLISHED:
2005
,
SOURCE:
Symposium on Science and Technology of Nitrides and Related Materials/Wide Band Gap II-VI Semiconductors held at the E-MRS 2004 Fall Meeting
in
E-MRS 2004 Fall Meeting Symposia C and F,
VOLUME:
2,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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