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Katharina Lorenz
AuthID:
R-000-90E
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (236)
Proceedings Paper (42)
Review (6)
Article in Press (6)
Correction (4)
Editorial Material (2)
Erratum (1)
Book Chapter (1)
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Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Title Dsc
Results:
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Confirmed Publications: 298
261
TITLE:
Lattice order in thulium-doped GaN epilayers: In situ doping versus ion implantation
Full Text
AUTHORS:
Hernández, S; Cuscó, R; Artús, L; Nogales, E; R.W Martin; K.P O’Donnell; Halambalakis, G; Briot, O;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Optical Materials,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
262
TITLE:
Optical and structural studies in Eu-implanted AlN films
Full Text
AUTHORS:
Peres, M; Cruz, A;
Soares, MJ
;
Neves, AJ
;
Monteiro, T
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
263
TITLE:
Optical doping of AlN by rare earth implantation
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
;
Monteiro, T
;
Soares, MJ
; Peres, M; Smulders, PJM;
PUBLISHED:
2006
,
SOURCE:
14th International Conference on Ion Beam Modification of Materials (IBMM 2004)
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
242,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
264
TITLE:
Optical properties of high-temperature annealed Eu-implanted GaN
Full Text
AUTHORS:
Wang, K;
Martin, RW
; Nogales, E; Katchkanov, V; O'Donnell, KP; Hernandez, S;
Lorenz, K
;
Alves, E
;
Ruffenach, S
; Briot, O;
PUBLISHED:
2006
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
265
TITLE:
Rare earth ion implantation in GaN: Damage formation and recovery
AUTHORS:
Gloux, F; Ruterana, P; Wojtowicz, T;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
35th International School on the Physics of Semiconducting Compounds
in
ACTA PHYSICA POLONICA A,
VOLUME:
110,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
|
CIÊNCIAVITAE
266
TITLE:
Structure and role of ultrathin AlN layers for improving optical activation of rare earth implanted GaN
Full Text
AUTHORS:
Wojtowicz, T
;
Gloux, F
;
Ruterana, P
;
Nouet, G
; Bodiou, L; Braud, A;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
6th International Conference on Nitride Semiconductors (ICNS-6)
in
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS,
VOLUME:
243,
ISSUE:
7
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
267
TITLE:
Structure and role of ultrathin AlN layers for improving optical activation of rare earth implanted GaN
Full Text
AUTHORS:
Wójtowicz, T
;
Gloux, F
;
Ruterana, P
; Nouet, G; Bodiou, L; Braud, A;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
physica status solidi (b) - phys. stat. sol. (b),
VOLUME:
243,
ISSUE:
7
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
268
TITLE:
TEM investigation of Tm implanted GaN, the influence of high temperature annealing
Full Text
AUTHORS:
Wojtowicz, T; Gloux, F; Ruterana, P;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Meeting of the European-Materials-Research-Society
in
OPTICAL MATERIALS,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
269
TITLE:
TEM investigation of Tm implanted GaN, the influence of high temperature annealing
Full Text
AUTHORS:
Wójtowicz, T
;
Gloux, F
;
Ruterana, P
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Optical Materials,
VOLUME:
28,
ISSUE:
6-7
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
270
TITLE:
The structure of crystallographic damage in GaN formed during rare earth ion implantation with and without an ultrathin AlN capping layer
Full Text
AUTHORS:
Gloux, F
;
Ruterana, P
;
Wojtowicz, T
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2006
,
SOURCE:
Symposium on Material Science and Technology of Wide Bandgap Semiconductors held at the 2006 Spring Meeting of the EMRS
in
SUPERLATTICES AND MICROSTRUCTURES,
VOLUME:
40,
ISSUE:
4-6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
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