Jakub Kral
AuthID: R-003-7C3
1
TITLE: An SVM approach with electromagnetic methods to assess metal plate thickness Full Text
AUTHORS: Helena G Ramos ; Tiago Rocha; Jakub Kral; Dario Pasadas; Artur L Ribeiro;
PUBLISHED: 2014, SOURCE: MEASUREMENT, VOLUME: 54
AUTHORS: Helena G Ramos ; Tiago Rocha; Jakub Kral; Dario Pasadas; Artur L Ribeiro;
PUBLISHED: 2014, SOURCE: MEASUREMENT, VOLUME: 54
2
TITLE: The Lift-Off Effect in Eddy Currents on Thickness Modeling and Measurement
AUTHORS: Jakub Kral; Radislav Smid; Helena Maria G Geirinhas Ramos ; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 7
AUTHORS: Jakub Kral; Radislav Smid; Helena Maria G Geirinhas Ramos ; Lopes Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 7
3
TITLE: Assessing metal plate thickness: An SVM approach with electromagnetic methods
AUTHORS: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
AUTHORS: Ramos, HG ; Rocha, T; Kral, J; Pasadas, D; Ribeiro, AL ;
PUBLISHED: 2013, SOURCE: 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications in 12th IMEKO TC10 Workshop on Technical Diagnostics: New Perspective in Measurements, Tools and Techniques for Industrial Applications, Proceedings
INDEXED IN: 
Scopus
Scopus4
TITLE: Thickness Measurement Using Transient Eddy Current Techniques Full Text
AUTHORS: Kral, J; Smid, R; Geirnhas Ramos, HMG ; Lopes Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
AUTHORS: Kral, J; Smid, R; Geirnhas Ramos, HMG ; Lopes Ribeiro, AL ;
PUBLISHED: 2011, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC)
