81
TITLE: Crystalline quality of InxGa1-xN samples assessed by SEM, Raman and PL
AUTHORS: Correia, R; Seitz, R; Gaspar, C; Monteiro, T; Pereira, E; Heuken, M; Schoen, O; Protzmann, H;
PUBLISHED: 1999, SOURCE: Conference on Microscopy of Semiconducting Materials in MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS, ISSUE: 164
INDEXED IN: WOS
Page 9 of 9. Total results: 81.