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Crystalline Quality of Inxga1-Xn Samples Assessed by Sem, Raman and Pl
AuthID
P-001-601
8
Author(s)
Correia, R
·
Seitz, R
·
Gaspar, C
·
Monteiro, T
·
Pereira, E
·
Heuken, M
·
Schoen, O
·
Protzmann, H
2
Editor(s)
Cullis, AG; Beanland, R
Document Type
Article
Year published
1999
Published
in
MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS
in
INSTITUTE OF PHYSICS CONFERENCE SERIES,
ISSN: 0951-3248
Issue: 164, Pages: 401-406 (6)
Conference
Conference on Microscopy of Semiconducting Materials,
Date:
MAR 22-25, 1999,
Location:
OXFORD, ENGLAND,
Sponsors:
Inst Phys, Electron Microscopy & Analy Grp, Royal Microscop Soc, Mat Res Soc, Hitachi Sci Instruments Ltd, JEOL (UK) Ltd, FEI Ltd,
Host:
UNIV OXFORD
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Wos
®
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Publication Identifiers
Wos
: WOS:000166835300086
Source Identifiers
ISSN
: 0951-3248
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