Tiago Miguel Laureano Alves
AuthID: R-000-H95
1
TITLE: A comparative study of code query technologies
AUTHORS: Alves, TL; Hage, J; Rademaker, P;
PUBLISHED: 2011, SOURCE: 11th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2011 in Proceedings - 11th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2011
AUTHORS: Alves, TL; Hage, J; Rademaker, P;
PUBLISHED: 2011, SOURCE: 11th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2011 in Proceedings - 11th IEEE International Working Conference on Source Code Analysis and Manipulation, SCAM 2011
INDEXED IN: 
Scopus 
CrossRef
Scopus CrossRef2
TITLE: Benchmark-based aggregation of metrics to ratings
AUTHORS: Alves, TL; Correia, JP; Visser, J;
PUBLISHED: 2011, SOURCE: Joint Conference of the 21st International Workshop on Software Measurement, IWSM 2011 and the 6th International Conference on Software Process and Product Measurement, MENSURA 2011 in Proceedings - Joint Conference of the 21st International Workshop on Software Measurement, IWSM 2011 and the 6th International Conference on Software Process and Product Measurement, MENSURA 2011
AUTHORS: Alves, TL; Correia, JP; Visser, J;
PUBLISHED: 2011, SOURCE: Joint Conference of the 21st International Workshop on Software Measurement, IWSM 2011 and the 6th International Conference on Software Process and Product Measurement, MENSURA 2011 in Proceedings - Joint Conference of the 21st International Workshop on Software Measurement, IWSM 2011 and the 6th International Conference on Software Process and Product Measurement, MENSURA 2011
INDEXED IN: Scopus CrossRef
Scopus CrossRef3
TITLE: Categories of Source Code in Industrial Systems
AUTHORS: Tiago L Alves;
PUBLISHED: 2011, SOURCE: 5th International Symposium on Empirical Software Engineering and Measurement (ESEM) in 2011 FIFTH INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2011)
AUTHORS: Tiago L Alves;
PUBLISHED: 2011, SOURCE: 5th International Symposium on Empirical Software Engineering and Measurement (ESEM) in 2011 FIFTH INTERNATIONAL SYMPOSIUM ON EMPIRICAL SOFTWARE ENGINEERING AND MEASUREMENT (ESEM 2011)
INDEXED IN: 
WOS
WOS4
TITLE: Assessment of Product Maintainability for Two Space Domain Simulators
AUTHORS: Tiago L Alves;
PUBLISHED: 2010, SOURCE: International Conference on Software Maintenance in 2010 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE
AUTHORS: Tiago L Alves;
PUBLISHED: 2010, SOURCE: International Conference on Software Maintenance in 2010 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE
INDEXED IN: WOS
WOS5
TITLE: Deriving metric thresholds from benchmark data
AUTHORS: Alves, TL; Ypma, C; Visser, J;
PUBLISHED: 2010, SOURCE: 2010 IEEE International Conference on Software Maintenance, ICSM 2010 in IEEE International Conference on Software Maintenance, ICSM
AUTHORS: Alves, TL; Ypma, C; Visser, J;
PUBLISHED: 2010, SOURCE: 2010 IEEE International Conference on Software Maintenance, ICSM 2010 in IEEE International Conference on Software Maintenance, ICSM
INDEXED IN: Scopus CrossRef
Scopus CrossRef6
TITLE: A Case Study in Grammar Engineering
AUTHORS: Tiago L Alves; Joost Visser;
PUBLISHED: 2009, SOURCE: 1st International Conference on Software Language Engineering in SOFTWARE LANGUAGE ENGINEERING, VOLUME: 5452
AUTHORS: Tiago L Alves; Joost Visser;
PUBLISHED: 2009, SOURCE: 1st International Conference on Software Language Engineering in SOFTWARE LANGUAGE ENGINEERING, VOLUME: 5452
INDEXED IN: WOS
WOS7
TITLE: Static Estimation of Test Coverage
AUTHORS: Tiago L Alves; Joost Visser;
PUBLISHED: 2009, SOURCE: 9th IEEE International Working Conference on Source Code Analysis and Manipulation in 2009 NINTH IEEE INTERNATIONAL WORKING CONFERENCE ON SOURCE CODE ANALYSIS AND MANIPULATION, PROCEEDINGS
AUTHORS: Tiago L Alves; Joost Visser;
PUBLISHED: 2009, SOURCE: 9th IEEE International Working Conference on Source Code Analysis and Manipulation in 2009 NINTH IEEE INTERNATIONAL WORKING CONFERENCE ON SOURCE CODE ANALYSIS AND MANIPULATION, PROCEEDINGS
