51
TITLE: Direct determination of atomic positions on the Cu(110)-(1×2)-H surface
AUTHORS: Mijiritskii, AV; Wahl, U; Langelaar, MH; Boerma, DO;
PUBLISHED: 1998, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 57, ISSUE: 15
INDEXED IN: Scopus
IN MY: ORCID
52
TITLE: Backscattering/channeling study of high-dose rare-earth implants into Si  Full Text
AUTHORS: Vantomme, A; Wahl, U; Wu, MF; Hogg, S; Pattyn, H; Langouche, G; Bender, H;
PUBLISHED: 1998, SOURCE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
INDEXED IN: Scopus WOS CrossRef
53
TITLE: Direct determination of the lattice site of H atoms on the (1 x 2) reconstructed Cu (110) surface  Full Text
AUTHORS: Mijiritskii, AV; Wahl, U; Langelaar, MH; Boerma, DO;
PUBLISHED: 1998, SOURCE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
INDEXED IN: Scopus WOS CrossRef
54
TITLE: Lattice site location studies of ion implanted Li-8 in GaN  Full Text
AUTHORS: Dalmer, M; Restle, M; Sebastian, M; Vetter, U; Hofsass, H; Bremser, MD; Ronning, C; Davis, RF; Wahl, U; Bharuth Ram, K;
PUBLISHED: 1998, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 84, ISSUE: 6
INDEXED IN: Scopus WOS
55
TITLE: Lattice sites and damage annealing of implanted Tm and Er in Si
AUTHORS: Wahl, U; Correia, JG ; De Wachter, J; Langouche, G; Marques, JG ; Moons, R; Vantomme, A;
PUBLISHED: 1997, SOURCE: Symposium on Defects and Diffusion in Silicon Processing in DEFECTS AND DIFFUSION IN SILICON PROCESSING, VOLUME: 469
INDEXED IN: Scopus WOS
56
TITLE: Emission channeling studies of Li in semiconductors  Full Text
AUTHORS: Wahl, U;
PUBLISHED: 1997, SOURCE: PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, VOLUME: 280, ISSUE: 3-4
INDEXED IN: Scopus WOS
57
TITLE: Channeled ion beam synthesis of erbium silicide: Comparison of experimental studies and binary collision simulations  Full Text
AUTHORS: Wahl, U; Vantomme, A; Wu, MF; Pattyn, H; Langouche, G;
PUBLISHED: 1997, SOURCE: 10th International Conference on Ion Beam Modification of Materials (IBMM-96) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 127
INDEXED IN: Scopus WOS CrossRef
58
TITLE: Direct evidence for stability of tetrahedral interstitial Er in Si up to 900 degrees C
AUTHORS: Wahl, U; Correia, JG; Langouche, G; Marques, JG;
PUBLISHED: 1997, SOURCE: 19th International Conference on Defects in Semiconductors (ICDS-19) in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, VOLUME: 258-2
INDEXED IN: WOS
59
TITLE: alpha-emission channeling studies of the lattice site of oversized atoms implanted in Fe and Ni single crystals (Reprinted from Nuclear Instruments and Methods in Physics Research B, vol 106, pg 23-27, 1995)
AUTHORS: DeWachter, J; Blasser, S; Hofsass, H; Jahn, S; Lindroos, M; Moons, R; Pattyn, H; Restle, M; Vantomme, A; Wahl, U; VanDuppen, P; Langouche, G;
PUBLISHED: 1996, SOURCE: 9th International Conference on Ion Beam Modification of Materials (IBMM 95) in ION BEAM MODIFICATION OF MATERIALS
INDEXED IN: WOS
60
TITLE: Thermal stability of substitutional ag in CdTe  Full Text
AUTHORS: Jahn, SG; Hofsass, H; Restle, M; Ronning, C; Quintel, H; BharuthRam, K; Wahl, U;
PUBLISHED: 1996, SOURCE: Symposium D on Purification, Doping and Defects in II-VI Materials, at the 1995 E-MRS Spring Conference in JOURNAL OF CRYSTAL GROWTH, VOLUME: 161, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
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