Vânia Sofia Soares Pereira Brissos
AuthID: R-000-HD6
71
TITLE: Buried word line planarization and roughness control for tunnel junction magnetic random access memory switching Full Text
AUTHORS: Sousa, RC; Soares, V; Silva, F; Bernardo, J; Freitas, PP;
PUBLISHED: 2000, SOURCE: 44th Annual Conference on Magnetism and Magnetic Materials in JOURNAL OF APPLIED PHYSICS, VOLUME: 87, ISSUE: 9
AUTHORS: Sousa, RC; Soares, V; Silva, F; Bernardo, J; Freitas, PP;
PUBLISHED: 2000, SOURCE: 44th Annual Conference on Magnetism and Magnetic Materials in JOURNAL OF APPLIED PHYSICS, VOLUME: 87, ISSUE: 9
72
TITLE: Temperature dependence and annealing effects on spin dependent tunnel junctions Full Text
AUTHORS: Sousa, RC; Sun, JJ; Soares, V; Freitas, PP ; Kling, A ; da Silva, MF; Soares, JC ;
PUBLISHED: 1999, SOURCE: 43rd Annual Conference on Magnetism and Magnetic Materials in JOURNAL OF APPLIED PHYSICS, VOLUME: 85, ISSUE: 8
AUTHORS: Sousa, RC; Sun, JJ; Soares, V; Freitas, PP ; Kling, A ; da Silva, MF; Soares, JC ;
PUBLISHED: 1999, SOURCE: 43rd Annual Conference on Magnetism and Magnetic Materials in JOURNAL OF APPLIED PHYSICS, VOLUME: 85, ISSUE: 8
73
TITLE: Low resistance spin-dependent tunnel junctions deposited with a vacuum break and radio frequency plasma oxidized Full Text
AUTHORS: Sun, JJ; Soares, V; Freitas, PP ;
PUBLISHED: 1999, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 74, ISSUE: 3
AUTHORS: Sun, JJ; Soares, V; Freitas, PP ;
PUBLISHED: 1999, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 74, ISSUE: 3
74
TITLE: Tunneling magnetoresistance and current distribution effect in spin-dependent tunnel junctions Full Text
AUTHORS: Sun, JJ; Sousa, RC; Galvao, TTP; Soares, V; Plaskett, TS; Freitas, PP ;
PUBLISHED: 1998, SOURCE: 7th Joint Magnetism and Magnetic Materials / International Magnetics Conference in JOURNAL OF APPLIED PHYSICS, VOLUME: 83, ISSUE: 11
AUTHORS: Sun, JJ; Sousa, RC; Galvao, TTP; Soares, V; Plaskett, TS; Freitas, PP ;
PUBLISHED: 1998, SOURCE: 7th Joint Magnetism and Magnetic Materials / International Magnetics Conference in JOURNAL OF APPLIED PHYSICS, VOLUME: 83, ISSUE: 11
