Nuno Pedro Serras Lucas Nobre Franco
AuthID: R-000-KNV
141
TITLE: Residual stresses and elastic modulus of thermal barrier coatings graded in porosity Full Text
AUTHORS: Portinha, A; Teixeira, V ; Carneiro, J ; Beghi, MG; Bottani, CE; Franco, N; Vassen, R; Stoever, D; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.
AUTHORS: Portinha, A; Teixeira, V ; Carneiro, J ; Beghi, MG; Bottani, CE; Franco, N; Vassen, R; Stoever, D; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.
142
TITLE: Direct evidence for strain inhomogeneity in InxGa1-xN epilayers by Raman spectroscopy Full Text
AUTHORS: Correia, MR ; Pereira, S ; Pereira, E; Frandon, J; Watson, IM; Liu, C; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 85, ISSUE: 12
AUTHORS: Correia, MR ; Pereira, S ; Pereira, E; Frandon, J; Watson, IM; Liu, C; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 85, ISSUE: 12
143
TITLE: Absolute scale reciprocal space mapping on X-ray diffractometers incorporating a position sensitive detector: Application to III-nitride semiconductors
AUTHORS: Franco, N; Pereira, S ; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
AUTHORS: Franco, N; Pereira, S ; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
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ORCID144
TITLE: Structural characterization and luminescence of Ge/Si quantum dots
AUTHORS: Fonseca, A; Sobolev, NA; Leitao, JP ; Carmo, MC; Franco, N; Presting, H; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
AUTHORS: Fonseca, A; Sobolev, NA; Leitao, JP ; Carmo, MC; Franco, N; Presting, H; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
INDEXED IN: Scopus WOS
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ORCID145
TITLE: Strain and composition distributions in wurtzite InGaN/GaN layers extracted from x-ray reciprocal space mapping (vol 80, pg 3913, 2002) Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Sequeira, AD; Franco, N; Watson, IM; Deatcher, CJ;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 18
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Sequeira, AD; Franco, N; Watson, IM; Deatcher, CJ;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 18
146
TITLE: Characterisation of corrosion products in Cr implanted Mg surfaces Full Text
AUTHORS: Vilarigues, M ; Alves, LC ; Nogueira, ID; Franco, N; Sequeira, AD; da Silva, RC;
PUBLISHED: 2002, SOURCE: 12th International Conference on Surface Modification of Materials by Ion Beams in SURFACE & COATINGS TECHNOLOGY, VOLUME: 158
AUTHORS: Vilarigues, M ; Alves, LC ; Nogueira, ID; Franco, N; Sequeira, AD; da Silva, RC;
PUBLISHED: 2002, SOURCE: 12th International Conference on Surface Modification of Materials by Ion Beams in SURFACE & COATINGS TECHNOLOGY, VOLUME: 158
147
TITLE: Structural and optical properties of InGaN/GaN layers close to the critical layer thickness Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; Trager Cowan, C; Sweeney, F; O'Donnell, KP; Alves, E ; Franco, N; Sequeira, AD;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 7
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; Trager Cowan, C; Sweeney, F; O'Donnell, KP; Alves, E ; Franco, N; Sequeira, AD;
PUBLISHED: 2002, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 81, ISSUE: 7
148
TITLE: Splitting of X-ray diffraction and photoluminescence peaks in InGaN/GaN layers Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Martin, RW; White, ME; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: Spring Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 93, ISSUE: 1-3
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Martin, RW; White, ME; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: Spring Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 93, ISSUE: 1-3
149
TITLE: Strain relaxation and compositional analysis of InGaN/GaN layers by Rutherford backscattering Full Text
AUTHORS: Alves, E ; Pereira, S ; Correia, MR ; Pereira, E; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
AUTHORS: Alves, E ; Pereira, S ; Correia, MR ; Pereira, E; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
150
TITLE: Application of high-resolution X-ray diffraction to study strain status in Si1-xGex/Si1-yGey/Si (001) heterostructures Full Text
AUTHORS: Chtcherbatchev, KD; Sequeira, AD; Franco, N; Barradas, NP ; Myronov, M; Mironov, OA; Parker, EHC;
PUBLISHED: 2002, SOURCE: 9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX) in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 91
AUTHORS: Chtcherbatchev, KD; Sequeira, AD; Franco, N; Barradas, NP ; Myronov, M; Mironov, OA; Parker, EHC;
PUBLISHED: 2002, SOURCE: 9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX) in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 91
