1
TITLE: High quality ion-induced secondary electron imaging for MeV nuclear microprobe applications
AUTHORS: Teo, EJ; Breese, MBH; Bettiol, AA; Watt, F; Alves, LC ;
PUBLISHED: 2004, SOURCE: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, VOLUME: 22, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
2
TITLE: Microscopic evaluation of spatial variations in material and charge transport properties of CdZnTe radiation detectors  Full Text
AUTHORS: Rath, S; Sellin, PJ; Breese, MBH; Herman, H; Alves, LC ; Holland, AH;
PUBLISHED: 2003, SOURCE: 9th European Symposium on Semiconductor Detectors in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, VOLUME: 512, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
3
TITLE: A photomultiplier-based secondary electron imaging system for a nuclear microprobe  Full Text
AUTHORS: Alves, LC ; Breese, MBH; da Silva, MF; Soares, JC;
PUBLISHED: 2002, SOURCE: 7th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 188, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
4
TITLE: Imaging of charge transport properties in polycrystalline CVD diamond using IBIC and IBIL microscopy  Full Text
AUTHORS: Breese, MBH; Sellin, PJ; Alves, LC ; Knights, AP; Sussmann, RS; Whitehead, AJ;
PUBLISHED: 2001, SOURCE: 7th International Conference on Nuclear Microprobe Technology and Applications in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 181, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
5
TITLE: Imaging of charge transport in polycrystalline diamond using ion-beam-induced charge microscopy  Full Text
AUTHORS: Sellin, PJ; Breese, MBH; Knights, AP; Alves, LC ; Sussmann, RS; Whitehead, AJ;
PUBLISHED: 2000, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 77, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
6
TITLE: Study of the crystalline quality of exfoliated surfaces in hydrogen-implanted silicon  Full Text
AUTHORS: Breese, MBH; Alves, LC ; Hoechbauer, T; Nastasi, M;
PUBLISHED: 2000, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 77, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
7
TITLE: Micron-scale analysis of SiC/SiCf composites using the new Lisbon nuclear microprobe  Full Text
AUTHORS: Alves, LC ; Breese, MBH; Alves, E ; Paul, A; da Silva, MR ; da Silva, MF; Soares, JC;
PUBLISHED: 2000, SOURCE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161
INDEXED IN: Scopus WOS CrossRef
8
TITLE: Defect imaging using convergent beam ion channeling patterns  Full Text
AUTHORS: Breese, MBH; Bailes, AA;
PUBLISHED: 1998, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 140, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
9
TITLE: An optimised beam rocking system to produce angle-resolved information from small areas  Full Text
AUTHORS: de Kerckhove, DG; Breese, MBH; Grime, GW;
PUBLISHED: 1998, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 140, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
10
TITLE: Strain and defect imaging in thin crystals using a nuclear microprobe  Full Text
AUTHORS: Breese, MBH; King, PJC; de Kerckhove, DG;
PUBLISHED: 1998, SOURCE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
INDEXED IN: Scopus WOS CrossRef
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