1
TITLE: Benchmarking of Nondestructive Testing for Additive Manufacturing
AUTHORS: Duarte, VR; Rodrigues, TA; Machado, MA; Pragana, JPM; Pombinha, P; Coutinho, L; Silva, CMA; Miranda, RM; Goodwin, C; Huber, DE; Oliveira, JP; Santos, TG;
PUBLISHED: 2021, SOURCE: 3D PRINTING AND ADDITIVE MANUFACTURING, VOLUME: 8, ISSUE: 4
INDEXED IN: WOS
2
TITLE: Revisiting Ionic Liquid Structure-Property Relationship: A Critical Analysis  Full Text
AUTHORS: Wagner Silva; Marcileia Zanatta; Ana Sofia Ferreira; Marta C Corvo; Eurico J Cabrita;
PUBLISHED: 2020, SOURCE: INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES, VOLUME: 21, ISSUE: 20
INDEXED IN: Scopus WOS
3
TITLE: Ion pair and solvation dynamics of [Bmim][BF4] + water system
AUTHORS: Joao Cascao; Wagner Silva; Ana S D Ferreira; Eurico J Cabrita;
PUBLISHED: 2018, SOURCE: MAGNETIC RESONANCE IN CHEMISTRY, VOLUME: 56, ISSUE: 2
INDEXED IN: WOS
4
TITLE: Negative pressure regimes in ionic liquids: Structure and interactions in stretched liquids as probed by NMR
AUTHORS: Silva, W; Veiga, HIM; Tariq, M; Cabrita, EJ; Esperança, JMSS; Canongia Lopes, JN; Rebelo, LPN;
PUBLISHED: 2018, SOURCE: Symposium on Molten Salts and Ionic Liquids 21 - AiMES 2018, ECS and SMEQ Joint International Meeting in ECS Transactions, VOLUME: 86, ISSUE: 14
INDEXED IN: Scopus
5
TITLE: Thermal stability in oxidative and protective environments of a-C:H cap layer on a functional gradient coating  Full Text
AUTHORS: Louro, C ; Wagner Moura, CW; Carvalho, N; Stueber, M; Cavaleiro, A ;
PUBLISHED: 2011, SOURCE: DIAMOND AND RELATED MATERIALS, VOLUME: 20, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 16
6
TITLE: The influence of the substrate on the mechanical properties of Si-doped DLC thin films
AUTHORS: Silva, CWME; Branco, JRT; Oliveira, MC ; Antunes, JM ; Cavaleiro, A ;
PUBLISHED: 2008, SOURCE: Advanced Materials Forum IV - Selected, peer reviewed papers from the 4th International Materials Symposium Materiais 2007 and 8th Encontro da Sociedade Portuguesa de Materiais - SPM in Materials Science Forum, VOLUME: 587-588
INDEXED IN: Scopus