C. Jeynes
AuthID: R-006-GF6
11
TITLE: Quality assurance in an implantation laboratory by high accuracy RBS Full Text
AUTHORS: Jeynes, C; Peng, N; Barradas, NP ; Gwilliam, RM;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
AUTHORS: Jeynes, C; Peng, N; Barradas, NP ; Gwilliam, RM;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
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TITLE: Accurate simulation of backscattering spectra in the presence of sharp resonances Full Text
AUTHORS: Barradas, NP ; Alves, E ; Jeynes, C; Tosaki, M;
PUBLISHED: 2006, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 247, ISSUE: 2
AUTHORS: Barradas, NP ; Alves, E ; Jeynes, C; Tosaki, M;
PUBLISHED: 2006, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 247, ISSUE: 2
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TITLE: A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films Full Text
AUTHORS: Barradas, NP ; Added, N; Arnoldbik, WM; Bogdanovic Radovic, I; Bohne, W; Cardoso, S ; Danner, C; Dytlewski, N; Freitas, PP ; Jaksic, M; Jeynes, C; Krug, C; Lennard, WN; Lindner, S; Linsmeier, C; Medunic, Z; Pelicon, P; Pezzi, RP; Radtke, C; Rohrich, J; ...More
PUBLISHED: 2005, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 227, ISSUE: 3
AUTHORS: Barradas, NP ; Added, N; Arnoldbik, WM; Bogdanovic Radovic, I; Bohne, W; Cardoso, S ; Danner, C; Dytlewski, N; Freitas, PP ; Jaksic, M; Jeynes, C; Krug, C; Lennard, WN; Lindner, S; Linsmeier, C; Medunic, Z; Pelicon, P; Pezzi, RP; Radtke, C; Rohrich, J; ...More
PUBLISHED: 2005, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 227, ISSUE: 3
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TITLE: Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Marriott, PK; Boudreault, G; Jenkin, M; Wendler, E; Webb, RP;
PUBLISHED: 2003, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, ISSUE: 7
AUTHORS: Jeynes, C; Barradas, NP ; Marriott, PK; Boudreault, G; Jenkin, M; Wendler, E; Webb, RP;
PUBLISHED: 2003, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, ISSUE: 7
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TITLE: Accurate determination of the stopping power of He-4 in Si using Bayesian inference Full Text
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLISHED: 2002, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 194, ISSUE: 1
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLISHED: 2002, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 194, ISSUE: 1
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TITLE: Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure Full Text
AUTHORS: Gurbich, AF; Barradas, NP ; Jeynes, C; Wendler, E;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
AUTHORS: Gurbich, AF; Barradas, NP ; Jeynes, C; Wendler, E;
PUBLISHED: 2002, SOURCE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, ISSUE: 1-4
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TITLE: Determination of stopping power of ions in matter
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLISHED: 2001, SOURCE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS
AUTHORS: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLISHED: 2001, SOURCE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS
INDEXED IN: 
WOS
WOS18
TITLE: Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride) Full Text
AUTHORS: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLISHED: 2001, SOURCE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, ISSUE: 19
AUTHORS: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLISHED: 2001, SOURCE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, ISSUE: 19
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TITLE: Error performance analysis of artificial neural networks applied to Rutherford backscattering Full Text
AUTHORS: Vieira, A; Barradas, NP ; Jeynes, C;
PUBLISHED: 2001, SOURCE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 31, ISSUE: 1
AUTHORS: Vieira, A; Barradas, NP ; Jeynes, C;
PUBLISHED: 2001, SOURCE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 31, ISSUE: 1
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TITLE: Accurate depth profiling of complex optical coatings Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLISHED: 2000, SOURCE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, ISSUE: 1
AUTHORS: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLISHED: 2000, SOURCE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, ISSUE: 1
