L. Toniutti
AuthID: R-007-216
1
TITLE: Depth profiling of defects in He implanted SiO2
AUTHORS: Mariazzi, S; Toniutti, L; Brusa, RS; Duarte D Naia ; Karbowski, A; Karwasz, GP;
PUBLISHED: 2008, SOURCE: 37th Polish Seminar on Positron Annihilation in ACTA PHYSICA POLONICA A, VOLUME: 113, ISSUE: 5
AUTHORS: Mariazzi, S; Toniutti, L; Brusa, RS; Duarte D Naia ; Karbowski, A; Karwasz, GP;
PUBLISHED: 2008, SOURCE: 37th Polish Seminar on Positron Annihilation in ACTA PHYSICA POLONICA A, VOLUME: 113, ISSUE: 5
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Scopus 
WOS
Scopus WOS