D. Eyidi
AuthID: R-007-2BM
1
TITLE: Influence of stoichiometry and structure on the optical properties of AlNxOy films Full Text
AUTHORS: Borges, J; Barradas, NP ; Alves, E ; Beaufort, MF; Eyidi, D; Vaz, F ; Marques, L ;
PUBLISHED: 2013, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 46, ISSUE: 1
AUTHORS: Borges, J; Barradas, NP ; Alves, E ; Beaufort, MF; Eyidi, D; Vaz, F ; Marques, L ;
PUBLISHED: 2013, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 46, ISSUE: 1
2
TITLE: Electrical properties of AlNxOy thin films prepared by reactive magnetron sputtering Full Text
AUTHORS: Borges, J; Martin, N; Barradas, NP ; Alves, E ; Eyidi, D; Beaufort, MF; Riviere, JP; Vaz, F ; Marques, L ;
PUBLISHED: 2012, SOURCE: THIN SOLID FILMS, VOLUME: 520, ISSUE: 21
AUTHORS: Borges, J; Martin, N; Barradas, NP ; Alves, E ; Eyidi, D; Beaufort, MF; Riviere, JP; Vaz, F ; Marques, L ;
PUBLISHED: 2012, SOURCE: THIN SOLID FILMS, VOLUME: 520, ISSUE: 21
3
TITLE: Effect of hot-filament annealing in a hydrogen atmosphere on the electrical and structural properties of Nb-doped TiO2 sputtered thin films Full Text
AUTHORS: Tavares, CJ ; Castro, MV; Marins, ES; Samantilleke, AP ; Ferdov, S ; Rebouta, L ; Benelmekki, M; Cerqueira, MF ; Alpuim, P ; Xuriguera, E; Riviere, JP; Eyidi, D; Beaufort, MF; Mendes, A ;
PUBLISHED: 2012, SOURCE: THIN SOLID FILMS, VOLUME: 520, ISSUE: 7
AUTHORS: Tavares, CJ ; Castro, MV; Marins, ES; Samantilleke, AP ; Ferdov, S ; Rebouta, L ; Benelmekki, M; Cerqueira, MF ; Alpuim, P ; Xuriguera, E; Riviere, JP; Eyidi, D; Beaufort, MF; Mendes, A ;
PUBLISHED: 2012, SOURCE: THIN SOLID FILMS, VOLUME: 520, ISSUE: 7
4
TITLE: Mn-doped ZnO nanocrystals embedded in Al2O3: structural and electrical properties Full Text
AUTHORS: Khodorov, A ; Levichev, S ; Rolo, AG ; Karzazi, O; Chahboun, A ; Novak, J; Vorobiev, A; Tavares, CJ ; Eyidi, D; Riviere, JP; Beaufort, MF; Barradas, NP ; Alves, E ; Barber, DJ; Lanceros Mendez, S ; Gomes, MJM ;
PUBLISHED: 2010, SOURCE: NANOTECHNOLOGY, VOLUME: 21, ISSUE: 50
AUTHORS: Khodorov, A ; Levichev, S ; Rolo, AG ; Karzazi, O; Chahboun, A ; Novak, J; Vorobiev, A; Tavares, CJ ; Eyidi, D; Riviere, JP; Beaufort, MF; Barradas, NP ; Alves, E ; Barber, DJ; Lanceros Mendez, S ; Gomes, MJM ;
PUBLISHED: 2010, SOURCE: NANOTECHNOLOGY, VOLUME: 21, ISSUE: 50
