21
TITLE: Ion emission from solid electrolyte CsAg4Br2.68I2.32 film deposited on Ag-tip: Characteristics and applications  Full Text
AUTHORS: Wenbin B Zuo; Vasiliy O Pelenovich; Alexander B Tolstogouzov; Alexei E Ieshkin; Xiaomei M Zeng; Zhenguo G Wang; Gennady Gololobov; Dmitriy Suvorova; Chuansheng S Liu; Dejun J Fu; Donghong H Hu;
PUBLISHED: 2019, SOURCE: VACUUM, VOLUME: 167
INDEXED IN: Scopus WOS
22
TITLE: Method of Direct Detection and Investigation of Long-Lived Excited States of Singly and Multiply Charged Ions of Transition and Rare-Earth Metals  Full Text
AUTHORS: Belykh, SF; Tolstoguzov, AB; Bekkerman, AD; Bogdanova, TV;
PUBLISHED: 2019, SOURCE: JETP LETTERS, VOLUME: 109, ISSUE: 8
INDEXED IN: Scopus WOS
23
TITLE: Size determination of Ar clusters formed in conical nozzles  Full Text
AUTHORS: Pelenovich, V; Zeng, XM; Ieshkin, A; Zuo, WB; Chernysh, VS; Tolstogouzov, AB; Yang, B; Fu, DJ;
PUBLISHED: 2019, SOURCE: 23rd International Conference on Ion Beam Analysis (IBA) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 450
INDEXED IN: WOS
24
TITLE: Small Al cluster ion implantation into Si and 4H-SiC  Full Text
AUTHORS: Xiaomei M Zeng; Vasiliy Pelenovich; Alexei Ieshkin; Andrey Danilov; Alexander Tolstogouzov; Wenbin B Zuo; Jha Ranjana; Donghong H Hu; Neena Devi; Dejun J Fu; Xiangheng H Xiao;
PUBLISHED: 2019, SOURCE: RAPID COMMUNICATIONS IN MASS SPECTROMETRY, VOLUME: 33, ISSUE: 18
INDEXED IN: Scopus WOS
25
TITLE: Principles of the Construction and Computer Simulation of a Source of Homogeneous and Heterogeneous Cluster Ions  Full Text
AUTHORS: Belykh, SF; Bekkerman, AD; Tolstogouzov, AB; Lozovan, AA; Fu, DJ;
PUBLISHED: 2018, SOURCE: JOURNAL OF SURFACE INVESTIGATION, VOLUME: 12, ISSUE: 1
INDEXED IN: Scopus WOS
26
TITLE: Ion-Beam Sources Based on Solid Electrolytes for Aerospace Applications and Ion-Beam Technologies (Review)  Full Text
AUTHORS: Tolstoguzov, AB; Belykh, SF; Gololobov, GP; Gurov, VS; Gusev, SI; Suvorov, DV; Taganov, AI; Fud, DJ; Ai, Z; Liu, CS;
PUBLISHED: 2018, SOURCE: INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, VOLUME: 61, ISSUE: 2
INDEXED IN: Scopus WOS
27
TITLE: Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures  Full Text
AUTHORS: Drozdov, MN; Drozdov, YN; Chkhalo, NI; Polkovnikov, VN; Yunin, PA; Chirkin, MV; Gololobov, GP; Suvorov, DV; Fu, DJ; Pelenovich, V; Tolstogouzov, A;
PUBLISHED: 2018, SOURCE: THIN SOLID FILMS, VOLUME: 661
INDEXED IN: Scopus WOS
28
TITLE: Electrochemical Deposition of Ni-W Crack-Free Coatings  Full Text
AUTHORS: Dmitriy V Suvorov; Gennady P Gololobov; Dmitriy Yu Tarabrin; Evgeniy V Slivkin; Sergey M Karabanov; Alexander Tolstoguzov;
PUBLISHED: 2018, SOURCE: COATINGS, VOLUME: 8, ISSUE: 7
INDEXED IN: Scopus WOS
29
TITLE: Surface composition of Cd1-xFe(Mn)(x)Te1-ySey systems exposed to air  Full Text
AUTHORS: Nenad Bundaleski; Ivana Radisavljevic; Joao Trigueiro; Alexander Tolstogouzov; Zlatko Rakocevic; Mirjana Medic; Orlando M N D Teodoro ; Nebojsa Romcevic; Nenad Ivanovic;
PUBLISHED: 2017, SOURCE: MATERIALS CHEMISTRY AND PHYSICS, VOLUME: 189
INDEXED IN: Scopus WOS
30
TITLE: Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry  Full Text
AUTHORS: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLISHED: 2016, SOURCE: THIN SOLID FILMS, VOLUME: 607
INDEXED IN: Scopus WOS CrossRef
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