Apostolos Marinopoulos
AuthID: R-000-VFT
31
TITLE: Hydrogen impurity in paratellurite alpha-TeO2: Muon-spin rotation and ab initio studies
AUTHORS: Vilao, RC ; Marinopoulos, AG; Vieira, RBL; Weidinger, A; Alberto, HV ; Piroto Duarte, JP ; Gil, JM ; Lord, JS; Cox, SFJ;
PUBLISHED: 2011, SOURCE: PHYSICAL REVIEW B, VOLUME: 84, ISSUE: 4
AUTHORS: Vilao, RC ; Marinopoulos, AG; Vieira, RBL; Weidinger, A; Alberto, HV ; Piroto Duarte, JP ; Gil, JM ; Lord, JS; Cox, SFJ;
PUBLISHED: 2011, SOURCE: PHYSICAL REVIEW B, VOLUME: 84, ISSUE: 4
INDEXED IN: 
Scopus 
WOS
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ORCID
ORCID32
TITLE: Local-field and excitonic effects in the optical response of alpha-alumina
AUTHORS: Marinopoulos, AG; Myrta Gruening;
PUBLISHED: 2011, SOURCE: PHYSICAL REVIEW B, VOLUME: 83, ISSUE: 19
AUTHORS: Marinopoulos, AG; Myrta Gruening;
PUBLISHED: 2011, SOURCE: PHYSICAL REVIEW B, VOLUME: 83, ISSUE: 19
33
TITLE: Seeing inside materials by aberration-corrected electron microscopy
AUTHORS: Pennycook, SJ; Van Benthem, K; Marinopoulos, AG; Oh, SH; Molina, SI; Borisevich, AY; Luo, W; Pantelides, ST;
PUBLISHED: 2011, SOURCE: International Journal of Nanotechnology, VOLUME: 8, ISSUE: 10-12
AUTHORS: Pennycook, SJ; Van Benthem, K; Marinopoulos, AG; Oh, SH; Molina, SI; Borisevich, AY; Luo, W; Pantelides, ST;
PUBLISHED: 2011, SOURCE: International Journal of Nanotechnology, VOLUME: 8, ISSUE: 10-12
34
TITLE: Hydrogen impurity in paratellurite α -TeO 2 : Muon-spin rotation and ab initio studies
AUTHORS: Vilão, RC; Marinopoulos, AG; Vieira, RBL; Weidinger, A; Alberto, HV; Piroto P Duarte; Gil, JM; Lord, JS; Cox, SFJ;
PUBLISHED: 2011, SOURCE: Phys. Rev. B - Physical Review B, VOLUME: 84, ISSUE: 4
AUTHORS: Vilão, RC; Marinopoulos, AG; Vieira, RBL; Weidinger, A; Alberto, HV; Piroto P Duarte; Gil, JM; Lord, JS; Cox, SFJ;
PUBLISHED: 2011, SOURCE: Phys. Rev. B - Physical Review B, VOLUME: 84, ISSUE: 4
35
TITLE: Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling Full Text
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2010, SOURCE: Solid-State Electronics, VOLUME: 54, ISSUE: 9
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2010, SOURCE: Solid-State Electronics, VOLUME: 54, ISSUE: 9
36
TITLE: Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, I; Tuttle, B; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: Symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films and Emerging Dielectrics held at the 215th ECS Meeting in SILICON NITRIDE, SILICON DIOXIDE, AND EMERGING DIELECTRICS 10, VOLUME: 19, ISSUE: 2
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, I; Tuttle, B; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: Symposium on Silicon Nitride, Silicon Dioxide Thin Insulating Films and Emerging Dielectrics held at the 215th ECS Meeting in SILICON NITRIDE, SILICON DIOXIDE, AND EMERGING DIELECTRICS 10, VOLUME: 19, ISSUE: 2
INDEXED IN: Scopus WOS
Scopus WOS IN MY: ORCID
ORCID37
TITLE: Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: 39th European Solid-State Device Research Conference, ESSDERC 2009 in ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: 39th European Solid-State Device Research Conference, ESSDERC 2009 in ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference
38
TITLE: Performance, reliability, radiation effects, and aging issues in microelectronics - From atomic-scale physics to engineering-level modeling
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: 35th European Solid-State Circuits Conference, ESSCIRC 2009 in ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference
AUTHORS: Pantelides, ST; Tsetseris, L; Beck, MJ; Rashkeev, SN; Hadjisavvas, G; Batyrev, IG; Tuttle, BR; Marinopoulos, AG; Zhou, XJ; Fleetwood, DM; Schrimpf, RD;
PUBLISHED: 2009, SOURCE: 35th European Solid-State Circuits Conference, ESSCIRC 2009 in ESSCIRC 2009 - Proceedings of the 35th European Solid-State Circuits Conference
39
TITLE: Performance, Reliability, Radiation Effects, and Aging Issues in Microelectronics - From Atomic-Scale Physics to Engineering-Level Modeling
AUTHORS: Sokrates T Pantelides; Leonidas Tsetseris; Matthew J Beck; Sergey N Rashkeev; George Hadjisavvas; Iskander Batyrev; Blair Tuttle; Apostolos G Marinopoulos; Xing Zhou; Daniel M Fleetwood; Ronald Schrimpf;
PUBLISHED: 2009, SOURCE: ECS Transactions
AUTHORS: Sokrates T Pantelides; Leonidas Tsetseris; Matthew J Beck; Sergey N Rashkeev; George Hadjisavvas; Iskander Batyrev; Blair Tuttle; Apostolos G Marinopoulos; Xing Zhou; Daniel M Fleetwood; Ronald Schrimpf;
PUBLISHED: 2009, SOURCE: ECS Transactions
40
TITLE: Microscopic Characterization of Devices by Scanning Transmission Electron Microscopy: From Single Atom Imaging to Macroscopic Properties
AUTHORS: Pennycook, SJ; van v Benthem; Marinopoulos, AG; Pantelides, ST;
PUBLISHED: 2009, SOURCE: Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials
AUTHORS: Pennycook, SJ; van v Benthem; Marinopoulos, AG; Pantelides, ST;
PUBLISHED: 2009, SOURCE: Extended Abstracts of the 2009 International Conference on Solid State Devices and Materials
