Seeing Inside Materials by Aberration-Corrected Electron Microscopy

AuthID
P-00F-X8T
8
Author(s)
Pennycook, SJ
·
Van Benthem, K
·
Oh, SH
·
Molina, SI
·
Borisevich, AY
·
Luo, W
·
Pantelides, ST
Document Type
Article
Year published
2011
Published
in International Journal of Nanotechnology, ISSN: 1475-7435
Volume: 8, Issue: 10-12, Pages: 935-947
Indexing
Publication Identifiers
Scopus: 2-s2.0-84857201880
Source Identifiers
ISSN: 1475-7435
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.