Eduardo Jorge da Costa Alves
AuthID: R-000-4EK
211
TITLE: Study of damage formation and annealing of implanted III-nitride semiconductors for optoelectronic devices Full Text
AUTHORS: Faye, DN; Fialho, M; Magalhaes, S; Alves, E; Ben Sedrine, N; Rodrigues, J; Correia, MR; Monteiro, T; Bockowski, M; Hoffmann, V; Weyers, M; Lorenz, K;
PUBLISHED: 2016, SOURCE: 18th International Conference on Radiation Effects in Insulators (REI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 379
AUTHORS: Faye, DN; Fialho, M; Magalhaes, S; Alves, E; Ben Sedrine, N; Rodrigues, J; Correia, MR; Monteiro, T; Bockowski, M; Hoffmann, V; Weyers, M; Lorenz, K;
PUBLISHED: 2016, SOURCE: 18th International Conference on Radiation Effects in Insulators (REI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 379
212
TITLE: Quantum Well Intermixing and Radiation Effects in InGaN/GaN Multi Quantum Wells
AUTHORS: Lorenz, K; Redondo Cubero, A; Lourenco, MB; Sequeira, MC; Peres, M; Freitas, A; Alves, LC; Alves, E; Leitao, MP; Rodrigues, J; Ben Sedrine, N; Correia, MR; Monteiro, T;
PUBLISHED: 2016, SOURCE: Conference on Gallium Nitride Materials and Devices XI in GALLIUM NITRIDE MATERIALS AND DEVICES XI, VOLUME: 9748
AUTHORS: Lorenz, K; Redondo Cubero, A; Lourenco, MB; Sequeira, MC; Peres, M; Freitas, A; Alves, LC; Alves, E; Leitao, MP; Rodrigues, J; Ben Sedrine, N; Correia, MR; Monteiro, T;
PUBLISHED: 2016, SOURCE: Conference on Gallium Nitride Materials and Devices XI in GALLIUM NITRIDE MATERIALS AND DEVICES XI, VOLUME: 9748
213
TITLE: Spectroscopic analysis of the NIR emission in Tm implanted AlxGa1-xN layers Full Text
AUTHORS: Rodrigues, J; Fialho, M; Esteves, TC; Santos, NF; Ben Sedrine, N; Rino, L; Neves, AJ; Lorenz, K; Alves, E; Monteiro, T;
PUBLISHED: 2016, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 120, ISSUE: 8
AUTHORS: Rodrigues, J; Fialho, M; Esteves, TC; Santos, NF; Ben Sedrine, N; Rino, L; Neves, AJ; Lorenz, K; Alves, E; Monteiro, T;
PUBLISHED: 2016, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 120, ISSUE: 8
214
TITLE: Anisotropy of electrical conductivity in dc due to intrinsic defect formation in α-Al<inf>2</inf>O<inf>3</inf> single crystal implanted with Mg ions
AUTHORS: Tardío M.; Egaña A.; Ramírez R.; Muñoz-Santiuste J.E.; Alves E.;
PUBLISHED: 2016, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 379
AUTHORS: Tardío M.; Egaña A.; Ramírez R.; Muñoz-Santiuste J.E.; Alves E.;
PUBLISHED: 2016, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 379
215
TITLE: Quantitative x-ray diffraction analysis of bimodal damage distributions in Tm implanted Al 0.15 Ga 0.85 N Full Text
AUTHORS: Magalhães, S; Fialho, M; Peres, M; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., VOLUME: 49, ISSUE: 13
AUTHORS: Magalhães, S; Fialho, M; Peres, M; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., VOLUME: 49, ISSUE: 13
216
TITLE: Impact of implantation geometry and fluence on structural properties of AlxGa1-xN implanted with thulium Full Text
AUTHORS: Fialho, M; Magalhaes, S; Chauvat, MP; Ruterana, P; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 120, ISSUE: 16
AUTHORS: Fialho, M; Magalhaes, S; Chauvat, MP; Ruterana, P; Lorenz, K; Alves, E;
PUBLISHED: 2016, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 120, ISSUE: 16
217
TITLE: High Orbital Angular Momentum Harmonic Generation
AUTHORS: Vieira, J; Trines, RMGM; Alves, EP; Fonseca, RA; Mendonca, JT; Bingham, R; Norreys, P; Silva, LO;
PUBLISHED: 2016, SOURCE: PHYSICAL REVIEW LETTERS, VOLUME: 117, ISSUE: 26
AUTHORS: Vieira, J; Trines, RMGM; Alves, EP; Fonseca, RA; Mendonca, JT; Bingham, R; Norreys, P; Silva, LO;
PUBLISHED: 2016, SOURCE: PHYSICAL REVIEW LETTERS, VOLUME: 117, ISSUE: 26
218
TITLE: The role and application of ion beam analysis for studies of plasma-facing components in controlled fusion devices
AUTHORS: Rubel, M; Petersson, P; Alves, E; Brezinsek, S; Coad, JP; Heinola, K; Mayer, M; Widdowson, A;
PUBLISHED: 2016, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 371
AUTHORS: Rubel, M; Petersson, P; Alves, E; Brezinsek, S; Coad, JP; Heinola, K; Mayer, M; Widdowson, A;
PUBLISHED: 2016, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 371
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ORCID219
TITLE: Electrical insulation properties of RF-sputtered LiPON layers towards electrochemical stability of lithium batteries
AUTHORS: Vieira, EMF; Ribeiro, JF; Silva, MM; Barradas, NP; Alves, E; Alves, A; Correia, MR; Goncalves, LM;
PUBLISHED: 2016, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 49, ISSUE: 48
AUTHORS: Vieira, EMF; Ribeiro, JF; Silva, MM; Barradas, NP; Alves, E; Alves, A; Correia, MR; Goncalves, LM;
PUBLISHED: 2016, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 49, ISSUE: 48
220
TITLE: Correction to "Spectroscopic Analysis of Eu 3+ Implanted and Annealed GaN Layers and Nanowires"
AUTHORS: Rodrigues, J; Leitão, MF; Carreira, JFC; Ben Sedrine, N; Santos, NF; Felizardo, M ; Auzelle, T; Daudin, B; Alves, E; Neves, AJ; Correia, MR; Costa, FM; Lorenz, K; Monteiro, T;
PUBLISHED: 2016, SOURCE: Journal of Physical Chemistry C, VOLUME: 120, ISSUE: 12
AUTHORS: Rodrigues, J; Leitão, MF; Carreira, JFC; Ben Sedrine, N; Santos, NF; Felizardo, M ; Auzelle, T; Daudin, B; Alves, E; Neves, AJ; Correia, MR; Costa, FM; Lorenz, K; Monteiro, T;
PUBLISHED: 2016, SOURCE: Journal of Physical Chemistry C, VOLUME: 120, ISSUE: 12
