M. M. Giangregorio
AuthID: R-00F-9JS
1
TITLE: Dielectric function of nanocrystalline silicon with few nanometers (< 3 nm) grain size Full Text
AUTHORS: Losurdo, M; Giangregorio, MM; Capezzuto, P; Bruno, G; Cerqueira, MF ; Alves, E ; Stepikhova, M;
PUBLISHED: 2003, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 82, ISSUE: 18
AUTHORS: Losurdo, M; Giangregorio, MM; Capezzuto, P; Bruno, G; Cerqueira, MF ; Alves, E ; Stepikhova, M;
PUBLISHED: 2003, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 82, ISSUE: 18
2
TITLE: Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Alves, E ; Stepikhova, MV; Giangregorio, MM; Bruno, G;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 16, ISSUE: 3-4
AUTHORS: Losurdo, M; Cerqueira, MF ; Alves, E ; Stepikhova, MV; Giangregorio, MM; Bruno, G;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 16, ISSUE: 3-4
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TITLE: Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin films Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Stepikhova, MV; Alves, E ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
AUTHORS: Losurdo, M; Cerqueira, MF ; Stepikhova, MV; Alves, E ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
