Puchong Kijamnajsuk
AuthID: R-00G-13F
1
TITLE: Sputter deposition of thin films on different substrate materials analyzed by means of modulated IR radiometry Full Text
AUTHORS: Francisco Macedo ; Sutharat Chotikaprakhan; Puchong Kijamnajsuk; Filipe Vaz ; Roberto T Faria ; Juergen Gibkes; Josef Pelzl; Bruno K Bein;
PUBLISHED: 2011, SOURCE: 12th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 205, ISSUE: SUPPL. 2
AUTHORS: Francisco Macedo ; Sutharat Chotikaprakhan; Puchong Kijamnajsuk; Filipe Vaz ; Roberto T Faria ; Juergen Gibkes; Josef Pelzl; Bruno K Bein;
PUBLISHED: 2011, SOURCE: 12th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 205, ISSUE: SUPPL. 2
2
TITLE: Analysis of multifunctional oxycarbide and oxynitride thin films by modulated IR radiometry Full Text
AUTHORS: Gibkes, J; Vaz, F ; Fernandes, AC; Carvalho, P; Macedo, F ; Faria, RT; Kijamnajsuk, P; Pelzl, J; Bein, BK;
PUBLISHED: 2010, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 43, ISSUE: 39
AUTHORS: Gibkes, J; Vaz, F ; Fernandes, AC; Carvalho, P; Macedo, F ; Faria, RT; Kijamnajsuk, P; Pelzl, J; Bein, BK;
PUBLISHED: 2010, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 43, ISSUE: 39
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TITLE: Modulated IR radiometry as a tool for the thickness control of coatings Full Text
AUTHORS: Chotikaprakhan, S; Vaz, F ; Faria, RT; Fernandes, AC; Kijamnajsuk, P; Gibkes, J; Bein, BK; MacEdo, F ;
PUBLISHED: 2010, SOURCE: Journal of Physics: Conference Series, VOLUME: 214
AUTHORS: Chotikaprakhan, S; Vaz, F ; Faria, RT; Fernandes, AC; Kijamnajsuk, P; Gibkes, J; Bein, BK; MacEdo, F ;
PUBLISHED: 2010, SOURCE: Journal of Physics: Conference Series, VOLUME: 214
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