Francisco Andre Correa Alegria
AuthID: R-000-59K
1
TITLE: Phase Noise Influence on the Transfer Function Estimation of Analog to Digital Converters Using the Histogram Method
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: IEEE ACCESS, VOLUME: 13
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: IEEE ACCESS, VOLUME: 13
2
TITLE: Contribution of Jitter and Phase Noise to the Precision of Sinusoidal Amplitude Estimation Using Coherent Sampling
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: SCI, VOLUME: 7, ISSUE: 2
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: SCI, VOLUME: 7, ISSUE: 2
3
TITLE: Experimental validation of the precision of sinusoidal amplitude estimation using a least squares procedure in the presence of additive noise Full Text
AUTHORS: Mohsen Barzegar; Francisco Alegria;
PUBLISHED: 2025, SOURCE: Scientific Reports, VOLUME: 15, ISSUE: 1
AUTHORS: Mohsen Barzegar; Francisco Alegria;
PUBLISHED: 2025, SOURCE: Scientific Reports, VOLUME: 15, ISSUE: 1
4
TITLE: Expected value of the root mean square of sinefitting residuals in the presence of phase noise or sampling jitter
AUTHORS: Alegria, Francisco Andre Correa;
PUBLISHED: 2025, SOURCE: TM-TECHNISCHES MESSEN
AUTHORS: Alegria, Francisco Andre Correa;
PUBLISHED: 2025, SOURCE: TM-TECHNISCHES MESSEN
5
TITLE: Analytical derivation of sinusoidal offset estimation for finite-time series in the presence of phase noise or jitter Full Text
AUTHORS: Alegria, Francisco;
PUBLISHED: 2025, SOURCE: MEASUREMENT SCIENCE AND TECHNOLOGY, VOLUME: 36, ISSUE: 8
AUTHORS: Alegria, Francisco;
PUBLISHED: 2025, SOURCE: MEASUREMENT SCIENCE AND TECHNOLOGY, VOLUME: 36, ISSUE: 8
6
TITLE: Phase noise contribution to the precision of differential non-linearity estimation in analog-to-digital converters using the code density test
AUTHORS: Alegria, Francisco;
PUBLISHED: 2025, SOURCE: ACTA IMEKO, VOLUME: 14, ISSUE: 2
AUTHORS: Alegria, Francisco;
PUBLISHED: 2025, SOURCE: ACTA IMEKO, VOLUME: 14, ISSUE: 2
7
TITLE: Expected value of the root mean square of sinefitting residuals in the presence of phase noise or sampling jitter; [Erwartungswert des quadratischen Mittels der Sinefitting-Residuen bei Vorhandensein von Phasenrauschen oder Abtast-Jitter]
AUTHORS: Francisco André Corrêa Alegria;
PUBLISHED: 2025, SOURCE: Technisches Messen
AUTHORS: Francisco André Corrêa Alegria;
PUBLISHED: 2025, SOURCE: Technisches Messen
INDEXED IN: 
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TITLE: High Sensitive ECT Probe for Detection of Deeply Buried Defects
AUTHORS: Xie, Lian; Baskaran, Prashanth; Ribeiro, Artur L.; Alegria, Francisco C.; Feng, Bo; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: 2025 International Instrumentation and Measurement Technology Conference-I2MTC-Annual in 2025 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC
AUTHORS: Xie, Lian; Baskaran, Prashanth; Ribeiro, Artur L.; Alegria, Francisco C.; Feng, Bo; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: 2025 International Instrumentation and Measurement Technology Conference-I2MTC-Annual in 2025 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC
9
TITLE: Estimation of the Root Mean Square of the Residuals of Sine Fitting in the Presence of Phase Noise or Jitter
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: IEEE ACCESS, VOLUME: 13
AUTHORS: Alegria, Francisco A. C.;
PUBLISHED: 2025, SOURCE: IEEE ACCESS, VOLUME: 13
10
TITLE: Damage Imaging in a CFRP Plate Using UGW-Based Handheld Probe Full Text
AUTHORS: Pasadas, Dario J.; Barzegar, Mohsen; Zhang, Muchao; Alegria, Francisco; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 25, ISSUE: 20
AUTHORS: Pasadas, Dario J.; Barzegar, Mohsen; Zhang, Muchao; Alegria, Francisco; Ribeiro, Artur L.; Ramos, Helena G.;
PUBLISHED: 2025, SOURCE: IEEE SENSORS JOURNAL, VOLUME: 25, ISSUE: 20
