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High Sensitive Ect Probe for Detection of Deeply Buried Defects

AuthID
P-019-T94

Author(s)

Xie, L

Baskaran, P

Ribeiro, AL

Alegria, FC

Feng, B

Ramos, HG

Document Type

Proceedings Paper

Year published

2025

Published

in 2025 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, I2MTC in IEEE Instrumentation and Measurement Technology Conference, ISSN: 2642-2069

Pages: 1-6 (6)

Conference

2025 International Instrumentation and Measurement Technology Conference-I2Mtc-Annual, Date: MAY 19-22, 2025, Location: Chemnitz, GERMANY

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Metadata
Sources

Publication Identifiers

DOI: 10.1109/i2mtc62753.2025.11079107

Scopus: 2-s2.0-105012207722

Wos: WOS:001554207900173

Source Identifiers

ISSN: 2642-2069

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High Sensitive Ect Probe for Detection of Deeply Buried Defects

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