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TITLE: Security-Constrained Unit Commitment Problem With Transmission Switching Reliability and Dynamic Thermal Line Rating
AUTHORS: Morteza Sheikh; Jamshid Aghaei; Armin Letafat; Mohammad Rajabdorri; Taher Niknam; Miadreza Shafie Khah; João P. S. Catalão ;
PUBLISHED: 2019, SOURCE: IEEE SYSTEMS JOURNAL, VOLUME: 13, ISSUE: 4
INDEXED IN: Scopus WOS DBLP CrossRef: 36