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TITLE: Detecting System Errors in Virtual Reality Using EEG Through Error-Related Potentials
AUTHORS: Si Mohammed, H; Lopes Dias, C; Duarte, M; Argelaguet, F; Jeunet, C; Casiez, G; Muller Putz, GR; Lecuyer, A; Scherer, R;
PUBLISHED: 2020, SOURCE: 27th IEEE Conference on Virtual Reality and 3D User Interfaces, VR 2020 in Proceedings - 2020 IEEE Conference on Virtual Reality and 3D User Interfaces, VR 2020
INDEXED IN: Scopus