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TITLE: Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
AUTHORS: Ghosh, S; Haefner, J; Martin Albo, J; Guenette, R; Li, X; Loya A L Villalpando; Burch, C; Adams, C; Alvarez, V; Arazi, L; Arnquist, IJ; Azevedo, CDR; Bailey, K; Ballester, F; Benlloch Rodriguez, JM; Borges, FIGM; Byrnes, N; Carcel, S; Carrion, JV; Cebrian, S; Church, E; Conde, CAN; Contreras, T; Diaz, G; Diaz, J; Diesburg, M; Escada, J; Esteve, R; Felkai, R; Fernandes, AFM; Fernandes, LMP; Ferrario, P; Ferreira, AL; Freitas, EDC; Goldschmidt, A; Gomez Cadenas, JJ; Gonzalez Diaz, D; Gutierrez, RM; Hafidi, K; Hauptman, J; Henriques, CAO; Hernando A H Morata; Herrero, P; Herrero, V; Ifergan, Y; Jones, BJP; Kekic, M; Labarga, L; Laing, A; Lebrun, P; Lopez March, N; Losada, M; Mano, RDP; Martinez, A; Martinez Vara, M; Martinez Lema, G; McDonald, AD; Monrabal, F; Monteiro, CMB; Mora, FJ; Munoz M Vidal; Novella, P; Nygren, DR; Palmeiro, B; Para, A; Perez, J; Querol, M; Redwine, A; Renner, J; Repond, J; Riordan, S; Ripoll, L; Rodriguez R Garcia; Rodriguez, J; Rogers, L; Romeo, B; Romo Luque, C; Santos, FP; dos Santos, JMF; Simon, A; Sorel, M; Stiegler, T; Toledo, JF; Torrent, J; Uson, A; Veloso, JFCA; Webb, R; Weiss Babai, R; White, JT; Woodruff, K; Yahlali, N; ...More
PUBLISHED: 2020, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 15, ISSUE: 11
INDEXED IN: Scopus WOS