Clara Grygiel
AuthID: R-00K-ETM
1
TITLE: Examining Different Regimes of Ionization-Induced Damage in GaN Through Atomistic Simulations Full Text
AUTHORS: Sequeira, Miguel C.; Djurabekova, Flyura; Nordlund, Kai; Mattei, Jean Gabriel; Monnet, Isabelle; Grygiel, Clara; Alves, Eduardo; Lorenz, Katharina;
PUBLISHED: 2022, SOURCE: SMALL
AUTHORS: Sequeira, Miguel C.; Djurabekova, Flyura; Nordlund, Kai; Mattei, Jean Gabriel; Monnet, Isabelle; Grygiel, Clara; Alves, Eduardo; Lorenz, Katharina;
PUBLISHED: 2022, SOURCE: SMALL
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