Isabel Maria Silva Nobre Parreira Cacho Teixeira
AuthID: R-000-6DS
31
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
32
TITLE: Towards e-management as enabler for accelerated change
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXED IN: 
Scopus
Scopus33
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: 
WOS
WOS34
TITLE: MOSYS: A methodology for automatic object identification from system specification
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef35
TITLE: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXED IN: WOS
WOS36
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus
Scopus37
TITLE: From continuing education to continuing learning using self assessment and process monitoring
AUTHORS: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLISHED: 1998, SOURCE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
AUTHORS: Teixeira, IC; Teixeira, JP; Pile, M; Durao, D;
PUBLISHED: 1998, SOURCE: 7th World Conference on Continuing Engineering Education: the Knowledge Revolution - the Impact of New Technologies o n Learning in KNOWLEDGE REVOLUTION, THE IMPACT OF TECHNOLOGY ON LEARNING, PROCEEDINGS
INDEXED IN: WOS
WOS38
TITLE: Trends on microelectronic systems education
AUTHORS: Teixeira, IC; Teixeira, JP;
PUBLISHED: 1998, SOURCE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
AUTHORS: Teixeira, IC; Teixeira, JP;
PUBLISHED: 1998, SOURCE: 2nd European Workshop on Microelectronics Education in MICROELECTRONICS EDUCATION
INDEXED IN: WOS
WOS39
TITLE: A strategy for testability enhancement at layout level
AUTHORS: Teixeira, JP; Teixeira, IC; Almeida, CFB; Goncalves, FM; Goncalves, J; Crespo, R;
PUBLISHED: 1990, SOURCE: 1990 European Design Automation Conference, EDAC 1990 in Proceedings of the European Design Automation Conference, EDAC 1990
AUTHORS: Teixeira, JP; Teixeira, IC; Almeida, CFB; Goncalves, FM; Goncalves, J; Crespo, R;
PUBLISHED: 1990, SOURCE: 1990 European Design Automation Conference, EDAC 1990 in Proceedings of the European Design Automation Conference, EDAC 1990
INDEXED IN: Scopus
Scopus