Octavio Pascoa Dias
AuthID: R-002-8EN
31
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
32
TITLE: MOSYS: A methodology for automatic object identification from system specification
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXED IN: 
Scopus 
CrossRef
Scopus CrossRef33
TITLE: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
34
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus
Scopus35
TITLE: Hardware/software specification, design and test using a system level approach
AUTHORS: DIas, OP; Jorge Semião ; Pereira, CE; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 12th Brazilian Symposium on Integrated Circuits and Systems Design, SBCCI 1999 in Proceedings - 12th Symposium on Integrated Circuits and Systems Design, SBCCI 1999
AUTHORS: DIas, OP; Jorge Semião ; Pereira, CE; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 12th Brazilian Symposium on Integrated Circuits and Systems Design, SBCCI 1999 in Proceedings - 12th Symposium on Integrated Circuits and Systems Design, SBCCI 1999
INDEXED IN: Scopus
Scopus